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Instrumentation for Total Reflection Fluorescent X-Ray Spectrometry
Published online by Cambridge University Press: 06 March 2019
Abstract
This article describes the instrumentation for a total reflection fluorescent x-ray spectrometer. The reflecting intensity and the angular divergence were studied with respect to various kinds of monochromators. Using silicon wafers, the angular divergence effect of the incident beam, surface roughness influences and the smoothing of background x-ray intensity for the improvement of the lower limit of detection were investigated.
- Type
- XII. Total Reflection XRS
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- Copyright
- Copyright © International Centre for Diffraction Data 1991