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Instantaneous Display of X-Ray Diffraction using a Diode Array Camera Tube

Published online by Cambridge University Press:  06 March 2019

Arthur N. Chester  and
Fred B. Koch
Arthur N. Chester
Affiliation:
Bell Telephone Laboratories, Incorporated, Murray Hill, New Jersey 079714
Fred B. Koch
Affiliation:
Bell Telephone Laboratories, Incorporated, Murray Hill, New Jersey 079714
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Abstract

The silicon diode array camera tube, recently developed for PICTURFPHONE® service, was modified to permit X-ray imaging. High quantum efficiency is attained without the use of a phosphor screen, since each photon absorbed in the silicon target generates several hundred hole-electron pairs for each keV of its energy, most of which can he usefully collected. The sensitivity and resolution are adequate to allow a continuous television display of the diffracted intensity as a crystal is oriented. Particular advantages of this technique include; high resolution (< 25 μm); electronically variable magnification; direct oscilloscope measurement of X-ray spot Intensity profiles and relative spot intensities because signal current is directly proportional to photon flux; high sensitivity in the range of 0.6 to 5.0 Å, potentially limited only "by counting statistics; integration times variable from < 1/60 second to minutes; and expected low cost, since the camera tube has no complicated electron imaging, and is directly interchangeable Mith a standard television vidicon. Applications which are described include crystal orientation and X-ray topography.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 12: Seventeenth Annual Conference on Applications of X-ray Analysis, August 21-23, 1968 , 1968 , pp. 165 - 173
Copyright
Copyright © International Centre for Diffraction Data 1968

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References

1. Crowell, M. H., Buck, T. M., Labuda, E. F., Dalton, J. V., and Walsh, E. J., “A Camera Tube with a Silicon Diode Array Target,” B.S.T.J. 46, 491 (1967).Google Scholar
2. Chester, A. N., Lcomis, T. C., and Weiss, M. M., “Diode Array Camera Tubes and X-ray Imaging,” Conference on Electron Device Research, Boulder, Colorado, June 19-21, 1968 (to be published).Google Scholar
3. Dozier, C. M., Gilfrich, J. V., and Birks, L. S., “Quantitative Calibration of X-ray Film Response in the 5 KeV to 1.3 MeV Region,” Appl. Optics 6, 2136 (1967).Google Scholar
4. Lonsdale, K., “Divergent-Beam X-ray Photography of Crystals,” Phil. Trans. Royal Roc. (London) 240, 219 (1947).Google Scholar
5. Barrett, C. S., “A New Microscopy and Its Potentials,” Trans. A.I.M.E. 161, 15 (1945).Google Scholar