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In Situ Rock Analysis

Published online by Cambridge University Press:  06 March 2019

J. Lantos  and
D. Litchinsky
J. Lantos
Affiliation:
Inax Instruments Limited, Ottawa, Ontario, Canada
D. Litchinsky
Affiliation:
Inax Instruments Limited, Ottawa, Ontario, Canada
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Abstract

Recent advances in solid state electronic circuitry and cryostat design have allowed the development of a low power consumption, fully portable XRF analyzer. The potential of such an instrument in geochemical surveying was investigated using the Inax 540 portable XRF pulse height analyzer/computer combined with the Inax 600 portable Si(Li) detector/dewar/LCD display. These two units comprise a total XRF analyzer and will determine and display the analyses of up to 36 elements simultaneously. Apart from providing a freshly exposed surface, no sample preparation is required.

Data illustrating the problems in the calibration of the unit for whole rock analysis are presented. Specifically data are presented on Uranium bearing rocks where the Uranium occurs along fracture lines in the medium. Results are compared with known assay and sampling problems are discussed.

Type
XRF Applications in the Minerals Industry
Information
Advances in X-Ray Analysis , Volume 23: Twenty-Eighth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1979 , 1979 , pp. 37 - 43
Copyright
Copyright © International Centre for Diffraction Data 1979

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References

1. Bowie, S.H.U., Darnley, A.G. and Rhodes, J. R., “Portable Radioisotope X-ray Fluorescence Analyzer”. Trans. Inst. Mining Met. 74; 316, 1965 Google Scholar
2. DeVoto, R.H., “Uranium Geology and Explorat ion”. Colorado School of Mines, Golden Colorado, March 1978 Google Scholar
3. Kimberley, M.M., “Short Course in Uranium Deposits; Their Mineralogy and Origin”, Mineralogical Assoc. of Canada, October 1978. Google Scholar
4. Munday, R.S., “Uranium Mineralization in N. Saskatchewan”, C.I.M. Bulletin, April 1979 Google Scholar