Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-23T12:13:04.488Z Has data issue: false hasContentIssue false
  • English
  • Français

High Resolution X-Ray Powder Diffraction by the Combination of Synchrotron Radiation and Imaging Plate to Observe Electron Distribution by the Maximum Entropy Method

Published online by Cambridge University Press:  06 March 2019

Masaki Takata ,
Manabu Yamada ,
Yoshiki Kubota  and
Makoto Sakata
Masaki Takata
Affiliation:
Department of Applied Physics, Nagoya University Chikusa-ku, Nagoya, 454-01, JAPAN
Manabu Yamada
Affiliation:
Department of Applied Physics, Nagoya University Chikusa-ku, Nagoya, 454-01, JAPAN
Yoshiki Kubota
Affiliation:
Department of Applied Physics, Nagoya University Chikusa-ku, Nagoya, 454-01, JAPAN
Makoto Sakata
Affiliation:
Department of Applied Physics, Nagoya University Chikusa-ku, Nagoya, 454-01, JAPAN
Get access

Abstract

A Debye-Scherrer camera (radius 572 mm) was designed for the use at the Photon Factory BL-6A2. It uses 4 pieces of the Imaging Plate to cover 0° ∼ 160° in 2θ. The profiles measured by the camera had 0.083° full width at half maximum (FWHM) and were rather symmetric compared with conventional X-ray source. The observed profiles were well represented by either the split Pearson VII or pseudo-Voigt function. In order to examine the performance of the new camera, the whole powder data of LiF was analyzed by the Maximum Entropy Method(MEM). The MEM analysis of LiF was successfully accomplished using 20 measured structure factors and gave R(Bragg) 0.25%. The density distribution obtained represented a characteristic feature of ionic crystals and was consistent with the theoretical result of the self-consistent LCAO method.

Type
I. Whole Pattern Fitting, Rietveld Analysis and Calculated Diffraction Patterns
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 85 - 90
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Cox, D.E., Hastings, J.B., Thomlinson, W. & Prewitt, C.T., Nucl. Instrum. Methods, 208: 573(1983).Google Scholar
2. Hastings, J.B., Thomlinson, W., & Cox, D.E., J.Appl.Cryst., 17: 85(1984).Google Scholar
3. Parrish, W., Hart, M. & Huang, T.C., J.Appl.Cryst., 19: 92(1986).Google Scholar
4. Thompson, P., Cox, D.E. & Hastings, J.B., J. Appl. Cryst., 20: 79(1987).Google Scholar
5. Lehmann, M.S., Christensen, A.N., Fjellvag, H., Feidenhans'l, R. & Nielsen, M., J.Appl.Cryst., 20: 123(1987).Google Scholar
6. Will, G., Bellotto, M., Parrish, W. & Hart, M., J.Appl.Cryst., 21: 182(1988).Google Scholar
7. McCusker, L., J.Appl.Cryst., 21: 305(1988).Google Scholar
8. Sakata, M. & Sato, M., Acta Cryst. A46: 263(1990).Google Scholar
9. Sakata, M., Mori, R., Kumazawa, S, Takata, M. & Toraya, H., J. Appl. Cryst., 23: 526(1990).Google Scholar
10. Uno, R., Ozawa, H., Yamanaka, T., Morikawa, H., Ando, M., Osumi, K., Nukui, A., Yukino, K. & Kawasaki, T., Aust.J.Phys.,41: 133(1988).Google Scholar
11. Toraya, H., J.Appl.Cryst., 19: 440(1986).Google Scholar
12. Collins, D.M., Nature(London), 298: 49(1982).Google Scholar
13. Sakata, M., Uno, T., Takata, M. & Mori, R., submitted to Acta Cryst.,B(1991).Google Scholar
14. Zunger, A. & Freeman, A.J., Phys.Rev., 816: 2901(1977).Google Scholar