Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Bowen, D.K.
Wormington, M.
and
McKeown, P.A.
1994.
Measurement of Surface Roughnesses and Topography at Nanometer Levels by Diffuse X-Ray Scattering.
CIRP Annals,
Vol. 43,
Issue. 1,
p.
497.
Wormington, M.
Sakurai, K.
Bowen, D.K.
and
Tanner, B.K.
1994.
Grazing Incidence X-Ray Reflectance Measurement of Surface and Interface Roughness on the Sub-Nanometre Scale.
MRS Proceedings,
Vol. 332,
Issue. ,
LaPuma, P. J.
Snyder, R. L.
Zdzieszynski, S.
and
Brückner, R.
1995.
Advances in X-Ray Analysis.
p.
705.
Lucca, D.A.
Brinksmeier, E.
and
Goch, G.
1998.
Progress in Assessing Surface and Subsurface Integrity.
CIRP Annals,
Vol. 47,
Issue. 2,
p.
669.
Zymierska, D.
2000.
Investigations of surface morphology and microrelief of GaAs single crystals by complementary methods.
Semiconductor Physics, Quantum Electronics and Optoelectronics,
Vol. 3,
Issue. 4,
p.
438.
Paszkowicz, Wojciech
2009.
Genetic Algorithms, a Nature-Inspired Tool: Survey of Applications in Materials Science and Related Fields.
Materials and Manufacturing Processes,
Vol. 24,
Issue. 2,
p.
174.
Lavery, Kristopher A
Prabhu, Vivek M
Satija, Sushil
and
Wu, Wen-li
2010.
Lateral uniformity in chemical composition along a buried reaction front in polymers using off-specular reflectivity.
Journal of Physics: Condensed Matter,
Vol. 22,
Issue. 47,
p.
474001.
Wogelius, Roy A.
and
Vaughan, David J.
2012.
Environmental Mineralogy II.
p.
5.
Jia, Yabin
Gao, Huifang
Li, Xu
Yao, Yaxuan
Wang, Meiling
Tao, Xingfu
Tian, Rongrong
Ren, Lingling
and
Qin, Lin
2016.
The thickness measurement of ultrathin films from new high-kmaterial HfO2by grazing incidence x-ray reflectivity.
Materials Research Express,
Vol. 3,
Issue. 6,
p.
065015.
Dominguez-Pacheco, A.
Hernandez-Aguilar, C.
and
Cruz-Orea, A.
2022.
Obtaining thermal images of creole corn by means of photoacoustic microscopy.
Journal of Applied Physics,
Vol. 131,
Issue. 21,