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The Geometrical Representation of Ternary Alloys and its Applications to X-Ray Fluorescence and Microprobe Analysis

Published online by Cambridge University Press:  06 March 2019

A. Taylor
Affiliation:
Westinghouse Research Laboratories, Pittsburgh, Pennsylvania
Brenda J. Kagle
Affiliation:
Westinghouse Research Laboratories, Pittsburgh, Pennsylvania
E. W. Beiter
Affiliation:
Westinghouse Research Laboratories, Pittsburgh, Pennsylvania
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Abstract

A simple and accurate graphical method is described for converting the composition of ternary alloys from weight per cent to atomic per cent, and vice versa. By making certain simplifying assumptions, the principles of the method are extended to the approximate determination of ternary alloy compositions from the count fractions obtained from fluorescence X-ray spectra. An example is given for the not-so-favorable system bismuth-germanium-tellurium. On account of the simpler excitation conditions, the same procedures may also be applied to X-ray microprobe analysis.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1961

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