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Formalism for the Evaluation of Pseudo-Macro Stress Fields σ33(z) from Q-AND ψ-Mode Diffraction Experiments Performed with Synchrotron Radiation

Published online by Cambridge University Press:  06 March 2019

H. Ruppersberg*
Affiliation:
FB Werkstoffwissenschaften Universität des Saarlandes D-6600 Saarbrücken, Germany
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Abstract

A self-consistent scheme is proposed for the evaluation of stressfields which vary strongly within the penetration depth of the X-rays in polycrystalline specimens which are elastically isotropic and homogeneous on a macroscopic scale. Very precise diffraction experiments have to be performed for practical applications.

Type
VII. Stress Determination by Diffraction Methods
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Noyan, I.C. and Cohen, J.B., Residual Stress Measurement by Diffraction and Interpretation. Springer (1987).Google Scholar
2. Wolfstieg, U. and Macherauch, E., HTM 31 (1976) 83; Wakabayashi, M., Nakuyama, M. and Nagata, A., J. Japan Soc. Prec. Eng. 43 (1977) 661,Google Scholar
3. Winholtz, R.A. and Cohen, J.B., Adv. X-Ray Anal. 32 (1989) 341.Google Scholar
4. Hauk, V. and H.-J. Nikolin, Texture and Microstructures 8&9 (1988) 693.Google Scholar
5. Nishioka, K., Hanabusa, T. and Fujiwara, H., Scripta Met. 8 (1974) 1349.Google Scholar
6. Noyan, I.C., Metall. Trans. 14A (1983) 1907.Google Scholar
7. Berveiller, M., Krier, J., Ruppersberg, H. and C.N.J. Wagner, Proc. IC0TOM 9, in print.Google Scholar
8. Ruppersberg, H., Detetnple, I. and Krier, J., phys. stat. sol. (a) 116 (1989) 681.Google Scholar
9. Ruppersberg, H., Detetnple, I. and Krier, J., Z. f. Kristallographie, in print.Google Scholar
10. Evenschor, P.D. and Hauk, V., Z. Metallkde. 66 (1975) 210.Google Scholar
11. Krier, J., Ruppersberg, H., Berveiller, M. and Liplnski, P., Proc. ICOTOM 9, in print.Google Scholar