Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-23T15:45:23.523Z Has data issue: false hasContentIssue false
  • English
  • Français

Focusing W Kα1 with a Curved Si Crystal

Published online by Cambridge University Press:  06 March 2019

M. A. Short ,
M. R. Fallon ,
D. J. Nagel  and
C. M. Dozier
M. A. Short
Affiliation:
SRS Technologies, 3501 Jamboree Road, #402 Newport Beach, CA 92660
M. R. Fallon
Affiliation:
SRS Technologies, 3501 Jamboree Road, #402 Newport Beach, CA 92660
D. J. Nagel
Affiliation:
Naval Research Laboratory, Code 4600 Washington, DC 20375-5000
C. M. Dozier
Affiliation:
Naval Research Laboratory, Code 4600 Washington, DC 20375-5000
Get access

Extract

The design, construction and operation of toroidal focusing X-ray monochromators have been described in detail by Marcus, et al. (1980) and by Furnas, et al. (1982), Marcus, et al. used 100 mechanically damaged, singly bent LiF (200) (2d = 4.02 Å) single crystals in a toroidal array to focus Cu Kα characteristic X-rays (8.04 keV, 1.54 Å, Θ = 22.6 deg). The diameter of the LiF toroid was 166 mm and the source-detector distance was 400 mm. Furnas, et al. used a series of singly bent, highly oriented graphite (2d = 6.72 Å) crystals, also in a toroidal array, to focus Pb Lα, Se Kα, Th Lα and U Lα X-rays (10.5 - 13.6 keV, 1.18 - 0.91 Å, Θ= 10.1 - 7.8 deg). Their system dimensions were not disclosed. The LiF and graphite crystals were both curved along the direction of X-ray propagation. That is, the cylindrical axes were orthogonal to the X-ray path.

Type
VI. XRD Instrumentation, Techniques and Reference Materials
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 401 - 405
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Criss, J.W., Birks, L.S., Gilfrich, J.V., 1978, Anal. Chem., 50:33.Google Scholar
Dozier, C.M., Gilfrich, I.V., Birks, L.S., 1967, Appl. Opt., 6:2136.Google Scholar
Dozier, C.M., Brown, D.B., Birks, L.S., Lyons, P.B., Benjamin, R.F., 1976, J. Appl. Phys., 47:3732.Google Scholar
Furnas, T.C., 1986, Personal Communication.Google Scholar
Furnas, T.C., Kuntz, G.S., and Furnas, R.E., 1982, Adv. in X-rav Anal., 25:59.Google Scholar
Marcus, M., Power, L.S., Storm, A.R., Kincaid, B.M. and Chance, B., 1980, Rev. Sci. Inst., 51:1023.Google Scholar
Salem, S.I., & Lee, P.L., 1976, Atom. Nucl. Data Tables. 18:233.Google Scholar
Short, M.A., & Fallon, M.R., 1990, X-Ray Spectrom., 19:35.Google Scholar
Warren, B.E., 1969, “X-Ray Diffraction,” p. 329, Addison-Wesley.Google Scholar