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Focusing Circle Errors in X-Ray Residual Stress Measurements of Nickel-Based Materials

Published online by Cambridge University Press:  06 March 2019

E. B. S. Pardue ,
M. R. James  and
R. W. Hendricks
E. B. S. Pardue
Affiliation:
Technology for Energy Corporation Knoxville, Tennessee
M. R. James
Affiliation:
Rockwell International Thousand Oaks, California
R. W. Hendricks
Affiliation:
Virginia Polytechnic Institute and State University Blacksburg, Virginia
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Extract

An unexplained anomalous sin2ψ split in x-ray stress measurements has consistently resulted from the use of Cr Kα radiation with nickel and austenitic stainless steels. Both, materials have diffraction peaks at low back-reflection angles for this radiation (nickel: 20 ⋍ 134°, austenitic stainless steel: 20 ⋍ 128°). The anomalous split is not evident when the measurements are made using Cr Kβ radiation, In an attempt to explain the errors produced by the Cr Kα radiation, focusing circle effects were analyzed and compared to experimental measurements made with both Cr Kα and Cr Kβ radiation on nickel-based samples,

Type
III. X-Ray Stress/Strain Determination, Fractography, Diffraction, Line Broadening Analysis
Information
Advances in X-Ray Analysis , Volume 31: Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987 , 1987 , pp. 205 - 212
Copyright
Copyright © International Centre for Diffraction Data 1987

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References

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