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Fluorescence Analysis of Trace Amounts of Hafnium in Zirconium Using a Silicon Crystal
Published online by Cambridge University Press: 06 March 2019
Abstract
The proper choice of an analyzing crystal sometimes makes It possible to suppress second-order reflections which interfere with X-ray fluorescence analysis. Some of the problems associated with the analysis of small amounts of hafnium in zirconium, using a silicon crystal and a pulse-height analyzer, are discussed.
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- Copyright © International Centre for Diffraction Data 1960