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Fast, High-Resolution X-ray Microfluorescence Imaging

Published online by Cambridge University Press:  06 March 2019

D. A. Carpenter  and
M. A. Taylor
D. A. Carpenter
Affiliation:
Martin Marietta Energy Systems, Inc. Oak Ridge Y-12 Plant Oak Ridge, Tennessee 37831-8084
M. A. Taylor
Affiliation:
Martin Marietta Energy Systems, Inc. Oak Ridge Y-12 Plant Oak Ridge, Tennessee 37831-8084
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Extract

X-ray micro fluorescence imaging refers to the use of an x-ray beam as a probe to excite XRF in a specimen and produce a spatially resolved image of the element distribution. The advantages of high sensitivity and low background, together with the nondestructive nature of the measurement, have lead to applications of x-ray microfluorescence analysis in biology, geology, materials science, as well as in the area of nondestructive evaluation. Previous reports have described the development of an x-ray microprobe which uses a conventional source of x-rays to produce a 10-μm beam. This paper describes improvements to the microprobe which have increased the beam power and the solid angle of detection. The data collection and display software have also been enhanced.

Type
V. XRF Instrumentation and Techniques
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990 , pp. 217 - 221
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

1. Carpenter, D. A., “Improved Laboratory X-Ray Source for Microfluorescence Analysis”, X-Ray Spectrometry, 18: 253 (1989).Google Scholar
2. Carpenter, D. A., Taylor, M. A., Holcombe, C. E., “Applications of A Laboratory X-Ray Microprobe to Materials Analysis”, in: Advances in X-Ray Analysis, 32:115, C. S. Barret, J. V. Gilfrich, R. Jenkins, T. C. Huang, P. K. Predecki, eds, Plenum Press, New York (1989).Google Scholar
3. Carpenter, D. A., Lawson, R. L., Taylor, M. A., Poirier, D. E., Morgan, K. Z., and Haney, G. W., “A Scanning X-Ray Microprobe with Glass Capillary Collimation”, in: Microbeam Analysis, D. E. Newbury, Ed., San Francisco Press, San Francisco, 391 (1988).Google Scholar
4. Grider, D. E., Wright, A., Aushurn, P. K., “Electron Beam Melting in Microfocus X-Ray Tubes”, J. Phys. D: Appl. Phys., 19: 2281 (1986).Google Scholar
5. Tertian, R. and Claisse, F., “Principles of Quantitative X-Ray Fluorescence Analysis”, Heyden, London, 1982.Google Scholar
6. VGACAD available from Dr. Marvin Gozum, 2 Independence Place Apt. 303-2, 6th and Locus Street, Philadelphia, PA 19106.Google Scholar