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Experimental Comparison of Widely Differing Lattice Parameters

Published online by Cambridge University Press:  06 March 2019

D. K. Bowen ,
B. K. Tanner ,
J. M. Hudson ,
I. Pape ,
N. Loxley  and
S. Tobin
D. K. Bowen
Affiliation:
Dept. of Engineering, University of Warwick, Coventry CV4 7AL, UK
B. K. Tanner
Affiliation:
Dept. of Physics, University of Durham, Durham DH3 1LE, UK
J. M. Hudson
Affiliation:
Dept. of Physics, University of Durham, Durham DH3 1LE, UK
I. Pape
Affiliation:
Dept. of Physics, University of Durham, Durham DH3 1LE, UK
N. Loxley
Affiliation:
Bede Scientific, Lindsey Park, Bowburn, Durham, DH6 5PF, U.K
S. Tobin
Affiliation:
Loral Infrared and Imaging Systems, Lexington, MA 02173, USA
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Extract

We report the implementation of two new methods of accurate comparison of lattice parameters against a silicon standard using a high resolution X-ray diffractometer. The double axis method uses a specimen rotation stage which set the limit of reproducibility (at 3 sigma) to 3 parts in 105. An application of the technique is illustrated in measurements of the zinc concentration in Cd1-xZnx Te to an accuracy of 0.1%. The triple axis technique uses beam conditioner and analyser crystals to define the incident and diffracted wave vectors. In measurement of the lattice parameters of InAs, we found a precision of 1 part in 105 and traceable accuracy of a several parts in 105.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 129 - 133
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

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