Hostname: page-component-cd9895bd7-jkksz Total loading time: 0 Render date: 2024-12-25T01:06:09.709Z Has data issue: false hasContentIssue false

The Evolution of X-Ray Instrumentation at Rich. Seifert & Co.

Published online by Cambridge University Press:  06 March 2019

A. Haase*
Affiliation:
Rich. Seifert & Co., Analytical X-ray systems D-22926 Ahrensburg, Germany
Get access

Extract

To facilitate orientation in time, some selected events will be briefly presented. Approximately five hundred years ago, Columbus discovered America. One hundred years ago, on November 8th, 1895, Wilhelm Conrad R6ntgen discovered the X-rays which in the German language are called after him. In 1912 Max von Laue conducted the first X-ray diffraction experiment. In 1892 Richard Seifert Sr. founded the Electrotechnical Plant in Hamburg. After World War I (1914-1918) the company founder gradually handed the firm over to his son Richard Seifert Jr. After his son had completed studies in physics and electrical engineering he conducted pioneering experiments on the application of X-rays in science and technology. From the very beginning, X-ray equipment was produced in the three fields of medicine, science and technology. It was only ten years after World War II (1939-1945) that the line of medical equipment was discontinued and the daughter [1] as a member of the third generation gradually took over executive management tasks.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Samusch, Elisabeth, President of Rich. Seifert & Co. GmbH & Co. KG, Ahrensburg Firmenchronik Rich. Seifert & Co., Private Communications, 1995 Google Scholar
[2] Schaefer, Michael, 100 Jahre Röntgenprüftechnik - Prüfsysteme früher und heute Jahrestagung der DGZfP, Aachen, 22 Mai 1995.Google Scholar
[3] Prange, A. and Schwenke, H., Trace Element Analysis Using Total-Reflection X-Ray Fluorescence Spectrometry, Adv. X-ray Anal 35B, B (1991) PICXAM.Google Scholar