Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-27T04:33:37.990Z Has data issue: false hasContentIssue false
  • English
  • Français

The Effects of Using Long Soller Slits as “Parallel Beam Optics” for Gixrd on Diffraction Data

Published online by Cambridge University Press:  06 March 2019

Michael O. Eatough  and
Raymond P. Gochner
Michael O. Eatough
Affiliation:
Chemical and X-ray Analysis Department 1824 Sandia National Laboratories, Albuquerque, NM 87185
Raymond P. Gochner
Affiliation:
Chemical and X-ray Analysis Department 1824 Sandia National Laboratories, Albuquerque, NM 87185
Get access

Abstract

Grazing incidence x-ray diffraction (GIXRD) using long soller slit assemblies and a flat crystal monochromator, sometimes referred to as thin film optics, are used to study poly crystal line thin films, polymers, metals, etc. The unique ability of GIXRD to characterize crystalline materials as function of depth and provide accurate strain measurements has lead to the growing popularity of this technique. This non-focusing pseudo-parallel beam geometry can produce various effects on diffraction data which can make interpretation difficult Artifacts such as peak splitting, kα2 distortion, and peaks which shift dramatically as a function of grazing incidence angle are observed when using GIXRD. These artifacts can be related to grazing incidence angle, the divergence of the soller plates, the thickness of the soller plates, the substrate material, and the type of monochromator used. This paper briefly describes some of the topics discussed at the 1992 & 1993 Denver Conferences workshops on parallel beam optics.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 167 - 173
Copyright
Copyright © International Centre for Diffraction Data 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Bertin, E. (1970). “Principles and Practices of X-Ray Spectrometric Analysis”, Plenum Press, 114-117, 361–364.Google Scholar
Goehner, R. P. and Eatough, M. O. (1992) “A Study of Grazing Incidence Configurations and Their Effect on X-Ray Diffraction Data”, Powder Diffraction, Vol, 7, No. 1, 2–5.Google Scholar
Goehner, R. P., and Nichols, M. C. (1986).“X-Ray Powder Diffraction”, Metals Handbook Ninth Edition, Vol. 10 Materials Characterization, American Society for Metals, 337.Google Scholar
Hart, M., Parrish, W., Bellotto, M., and Lim, G.S. (1988), “The refractive-Index Corrections in Powder Diffraction”, Acta Cryst. A44, 193–197.Google Scholar
Huang, T. C. (1990). “Surface and Ultra-Thin Characterization by Grazing Incident Asymmetric Bragg Diffraction”, Adv. in X-Ray Analysis, Vol. 33, Plenum Press, 91–99.Google Scholar
Huang, T.C. and Parrish, W. (1992), “Characterization of Single-and Multiple-Layer Films by X-ray Reflectometry”, Adv. in X-Ray Analysis, 35A, 137–142.Google Scholar
Rigaku, U.S.A. (1993), oral communication with R. A. Baldwin, Rigaku, USA, Danvera, MA.Google Scholar
SAE (1971). Residual Stress Measurements by X-Ray Diffraction - SAE J784a, Society of Automobile Engineers, Inc, Two Pennsylvania Plaza, NY, NY 100001 24–25.Google Scholar
Scintag (1993), oral communication with S. B. Robie, Scintag, Inc, Sunnyvale, CA.Google Scholar
Takayama, T., and Matsumoto, Y. (1990), “Effects of Refraction and Reflection on Analysis of Thin Films by the Grazing-Incident X-Ray Diffraction Method”, Adv. in X-Ray Analysis, Vol. 33, Plenum Press, 109–120.Google Scholar
Toney, M.F., Huang, T.C Brennan, S., and Zophia, R. (1988). “X-Ray Depth Profiling of Iron Oxide Thin Films”, J. of Material Research, Vol. 3 (2), 351–356, 1988.Google Scholar