We sought to determine how seriously surface roughness affects X-ray intensity measurements in polymers. Fourteen elements ranging from lead to silicon were added singly to fourteen batches of trans-1,4-polyisoprene. Smooth pressings of each batch were made, and intensity readings were taken (I0). Reproducibly rough surfaces were made from these by molding a square wire-mesh pattern into them, with the use of Tyler standard sieve screens. The amount of roughness was controlled by using screens of very fine to very coarse mesh. We studied the change in the X-ray intensity of the rough surfaces versus the smooth [(I/I0) × 100] with respect to: (1) the degree of roughness, (2) concentration of the added element, (3) emitted wavelength of the added element, (4) X-ray tube target material, and (5) correction for matrix effects on the intensity. We found that, at wavelengths emitted below 1 Å, intensity differences are small, regardless of which factors were varied. At wavelengths emitted above 1 Å, however, we found large differences. The intensity changes are highly dependent on roughness. Also, they become greater at the longer emitted wavelengths and with increasing concentration of added elements. Beginning with Ti Kα, losses are much higher with the use of chromium primary radiation than with tungsten. A technique of milling polyethylene into polymers with rough surfaces to provide a smooth surface is discussed.