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The Effect of Chemical Combination on Some Soft X-Ray K and L Emission Spectra*

Published online by Cambridge University Press:  06 March 2019

David W. Fischer
Affiliation:
Air Force Materials Laboratory, Wright-Patterson Air Force Base, Ohio
William L. Baun
Affiliation:
Air Force Materials Laboratory, Wright-Patterson Air Force Base, Ohio
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Abstract

X-ray spectrochemical analysis is a versatile technique that can be used to determine considerably more than just the elemental composition of a sample. X-ray lines and bands are, in many cases, influenced by the state of chemical combination of the element whose spectrum is being investigated. Significant effects due to changes in bonding are seen in the K and L spectra of the low atomic number elements which fall in the 20 to 90 Å region. Results using primary excitation, a stearate crystal, and a flow proportional counter are shown for the K spectra of boron, carbon, and nitrogen. Chlorine and sulfur L spectra from some simple metal compounds of these elements are also shown.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1965

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Footnotes

*

All rights reserved by the U.S. Air Force Materials Laboratory.

References

1. Henke, B. L., “X-Ray Fluorescence Analysis for Sodium, Fluorine, Oxygen, Nitrogen, Carbon, and Boron,” in: W. M. Mueller, G. R. Mallett, and M. J. Fay (eds.), Advances in X-Ray Analysis, Vol. 7, Plenum Press, New York, 1964, p. 460.Google Scholar
2. Baun, W. L. and Fischer, D. W., “The Effect of Valence and Coordination on AT Series Diagram and Non-Diagram Lines of Mg, Al, and Si,” in : W. M. Mueller, G. R. Mallett, and M. J. Fay (eds.), Advances in X-Ray Analysis, Vol. 8, Plenum Press, New York, 1965, p, 371.Google Scholar
3. Baun, W. L. and Fischer, D. W., “The Effect of Chemical Combination on K X-Ray Emission Spectra from Magnesium, Aluminum, and Silicon” AFML-TR-64-350, 1964.Google Scholar
4. Baun, W. L. and Fischer, D. W., “The Influence of Chemical Combination on Aluminum K Diagram and Non-Diagram Lines,” Nature 204: 642, 1964.Google Scholar
5. Fischer, D. W. and Baun, W. L., “Diagram and Non-Diagram Lines in K Spectra of Magnesium and Oxygen from Metallic and Anodized Magnesium,” Spectrochim. Acta 21: 443, 1965.Google Scholar
6. Fischer, D. W. and Baun, W. L., “Diagram and Non-Diagram Lines in K Spectra of Aluminum and Oxygen from Metallic and Anodized Aluminum,” J. Appl. Phys. 36: 534, 1965.Google Scholar
7. Fischer, D. W., “The Effect of Chemical Combination on the X-Ray K Emission Spectra of Oxygen and Fluorine,” J. Chem. Phys. 42: 3814, 1965.Google Scholar
8. Fisher, F., Crisp, R. S., and Williams, S. F., “A Photon Counting Spectrometer for the 50-100 Å Range,” Opt. Acta 5: 31, 1958.Google Scholar
9. Holliday, J. E., “Soft X-Ray Emission Spectroscopy in the 13 A to 44 A Region,” J. Appl. Phys. 33: 3259, 1962.Google Scholar
10. Holliday, J. E., “Soft X-Ray Emission Spectroscopy in the 10 A to 150 A Region,” in: E. F. Kadbe, Handbook of X-Rays, McGraw-Hill Book Company, New York, 1965, Chapter 38 (in press).Google Scholar
11. Piori, E. D., Harvey, G. G., Gyurgy, E. M., and Kingston, R. H., “The Soft X-Ray Spectroscopy of Solids,” Rev. Set. Instr. 23: 8, 1952,Google Scholar
12. Rogers, J. L. and Chalklin, F. C., “A Geiger Counter Vacuum Spectrometer and its Use for the Study of Soft X-Ray Lines,” Proc. Roy. Soc. (London) Ser. B 67: 384, 1954.Google Scholar
13. Landolt-Bomstein Tables, Vol. 1, 6th ed., Springer-Vetlag, Berlin, 1955, part 4. This reference contains a review by Faessler which includes a compilation of soft X-ray spectra and literature references up to 1955.Google Scholar
14. Baun, W. L. and Fischer, D. W., “Preparation and Use of Organic Compounds as Dispersing Devices for Long Wavelength X-Rays,” ASD-TDR-63-310, 1963.Google Scholar
15. Nicholson, J. B. and Wittry, D. B., “A Comparison of the Performance of Gratings and Crystals in the 20-115 A Region,” W. M. Mueller, G. R. Mallett, and M, J. Fay (eds.), Advances in X-Ray Analysis, Vol. 8, Plenum Press, New York, 1965, p. 497.Google Scholar
16. Furnas, T. C. and White, E. W., “A Program of Basic Research to Study X-Ray Spectra in the Region 15 to 50 Å,” WADD-TR-61-168, 1961.Google Scholar
17. Blodgett, K., “Films Built by Depositing Successive Unimolecular Layers on a Solid Surface,” J. Am. Chem. Soc. 57: 1007, 1935,Google Scholar
18. Edlén, B. and Svensson, L. A., “The Wavelengths of the Lyman Lines and Redetermination of the X-Unit from Tyrén's Spectrograms,” Arkiv. Fysik. 28: 427, 1965.Google Scholar
19. Kern, B., “Si Kg-Banden der Rontgencmissionsspektren von elementarem Silicium, Siliciumcarbid und Siliciumdioxyd,” Z. Physik. 159: 178, 1960.Google Scholar
20. Baun, W. L. and Fischer, D. W., “K X-Ray Emission Spectra from Silicon and Silicon Compounds,” Spectrochim. Acta., 1965 (in press),Google Scholar
21. Crisp, R. S. and Williams, S. F., “The Soft X-Ray Emission Spectra of Na, Be, B, Si and Li,” Phil Mag. 6: 365, 1961.Google Scholar
22. Crisp, R. S., “Soft X-Ray Emission from Potassium Metal in the 40 to 1000 A Range,” Phil. Mag. 5: 1161, 1960.Google Scholar
23. Pauling, L., The Nature of the Chemical Bond, 3rd ed., Cornell University Press, Ithaca, N.Y., 1960.Google Scholar
24. Schnell, E., “Zur Röntgenfluoreszenzanalyse, 2. Mitt.: Die Relativen Intensitäten der Kβ Strahlung Einiger Elemente Der 2 Periode,” Monatsk. Chem. 94: 703, 1963.Google Scholar
25. Siegbahn, K., “Electron Spectroscopy for Chemical Analysis,” Contract Report No. 2 (AF61-052-795), Institute of Physics, Uppsala University, September 1964.Google Scholar