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Diffusivity of Pt in BaxSrl-xTiO3 by XPS Compositional Depth Profiling

Published online by Cambridge University Press:  06 March 2019

Ali Naziripour  and
Art J. Nelson
Ali Naziripour
Affiliation:
Department of Physics, Campus Box 390, University of Colorado.
Art J. Nelson
Affiliation:
National Renewable Energy Laboratory, Cole Boulevard, Golden, CO 80401
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Abstract

This paper investigates the diffusion of Pt into polycrystalline thin-film BaxSr1-xTiO3 synthesized by sputter deposition and metal-organic deposition (MOD). Comparison of these two sets of films demonstrated that no remarkable interdiffusion was observed at the Pt/BSTO interface for the sputtered films. This is contrary to the films prepared by MOD which shows Pt has thoroughly diffused into BSTO films. The deeper diffusion of Pt into BSTO films prepared by MOD is attributed to die microstructure of these films. The effects of die diffusion on some physical properties have been discussed. Moreover, the effect of the heat-treatment on the diffusivity and other parameters is discussed

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 885 - 889
Copyright
Copyright © International Centre for Diffraction Data 1995

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