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Diffraction Peaks in X-Ray Spectroscopy: Friend or Foe?

Published online by Cambridge University Press:  06 March 2019

Ralph G. Tissot  and
Raymond P. Goehner
Ralph G. Tissot
Affiliation:
Chemical and X-ray Analysis Department Sandia National Laboratories Albuquerque, New Mexico 87185
Raymond P. Goehner
Affiliation:
Chemical and X-ray Analysis Department Sandia National Laboratories Albuquerque, New Mexico 87185
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Abstract

Diffraction peaks can occur as unidentifiable peaks in the energy spectrum of an x-ray spectrometric analysis. Recently, there has been increased interest in oriented thin polycrystalline films and epitaxial films on single crystal substrates for electronic applications. Since these materials diffract x-rays more efficiently than randomly oriented polycrystalline materials, diffraction peaks are being observed more frequently in x-ray fluorescent spectra In addition, micro x-ray spectrometric analysis utilizes a small, intense, collimated x-ray beam that can yield well defined diffraction peaks. In some cases these diffraction peaks can occur at the same position as elemental peaks. These diffraction peaks, although a possible problem in qualitative and quantitative elemental analysis, can give very useful information about the crystallographic structure and orientation of the material being analyzed. The observed diffraction peaks are dependent on the geometry of the x-ray spectrometer, the degree of collimation and the distribution of wavelengths (energies) originating from the x-ray tube and striking the sample.

Type
III. XRS Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 89 - 96
Copyright
Copyright © International Centre for Diffraction Data 1992

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