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Differential Photoionization Cross Section of Neon Subshells for the X-Ray Analysis by Photoelectron Spectrometry

Published online by Cambridge University Press:  06 March 2019

François Wuilleumier
François Wuilleumier*
Affiliation:
Transuranium Research Laboratory, Oak Ridge National, Laboratory, Oak Ridge, Tennessee 37830
*
†Guest Scientist from Laboratoire de Chimie Physique de l'Université Paris VI, ll rue Pierre et Marie Curie, Paris, France. (present address).
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Abstract

The new x-ray analysis method using photoeleetron spectrometry demands knowledge of differential photoionization cross sections of the subshells of the converter atoms used as intermediary between the x-ray spectrum and the photoelectron spectrum. These differential cross sections were determined for the most appropriate converter, the neon atom, in the energy range from 50 to 3000 eV. The total photoionization cross section was partitioned into contributions that arise from single ionization in the various subshells and from multiple processes. We present in tabular and graphical form: a) 1s, 2s and 2p total subshell cross sections; b) 1s, 2s and 2p differential cross sections at 54.73°; and c) ls, 2s and 2p differential cross sections at 90°. Accuracy is considered to be better than 3%, 7% and 5% at all energies for 1s, 2s and 2p cross sections, respectively.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 16: 'Twenty-First Annual Conference on Applications of X-ray Analysis, August 2-4, 1972 , 1972 , pp. 63 - 73
Copyright
Copyright © International Centre for Diffraction Data 1972

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References

1. Krause, M. O. and Wuilleumier, F., “X-Ray Analysis hy Photoelectron Spectrometry,” to be published in Proceedings of the International Conference on Inner Shell Ionization Phenomena, April 1972, Atlanta, Georgia, USA.Google Scholar
2. Krause, M. O., “Photoelectron Spectrometry: A New Approach to X-Ray Analysis,” to be published in Advances in X-Ray Analysis, Vol. 16, Plenum Press, New York (1973).Google Scholar
3. Wuilleumier, F and Krause, M. O., “Single and Multiple Photoionization Processes in Neon,” to be published in Phys. Rev. A(1973).Google Scholar
4. Cooper, J. W. and Manson, S. T., “Photo-Ionization in the Soft X-Ray Range: Angular Distributions of Photoelectrons and Interpretation in Terms of Subshell Structure,” Phys. Rev. 177, 157–163 (1969).Google Scholar
5. Cooper, J and Zare, R. N., “Angular Distributions of Photoelectrons,” J. Chem. Phys. 48, 942–943 (1968).Google Scholar
6. Krause, M. O., “Photo-Ionization of Krypton Between 300 and 1500 eV. Relative Subshell Cross Sections and Angular Distributions of Photoelectrons,” Phys. Rev. 177, 151–157 (1969).Google Scholar
7. Samson, J.A.R., “Angular Distribution of Photoelectrons,” J. Opt. Soc. Am. 59., 356–357 (1969).Google Scholar
8. McMaster, W. H., Del Grande, N. K., Mallett, J. H. aad Hubbel, J. H., “Compilation of X-Ray Cross Sections,” Report University of California UCRL-50174, See. II (1969).Google Scholar
9. Wuilleumier, F., “Etude de la discontinuityé d'alasorption K du Néon,” Compt. Rend. 270B, 825–827 (1970).Google Scholar
10. Henke, B. L. and Elgin, R. L., “X-Ray Absorption Tables for the 2 to 200 Å Region,” Advances in X-Ray Analysis., 13, 639–665 (1969).Google Scholar
11. Samson, J. A. R., “The Measurement of the Photoionization Cross Sections of the Atomic Gases,” Ad. Atom. Mol. Phys. 2, 177–266 (1966).Google Scholar
12. Ederer, D. L. and Tomboulian, D. H., “Photoionization Cross Section of Neon in the 80 to 600Å Region,” Phys. Rev. 133, A1525–1532 (1964).Google Scholar
13. Carlson, T. A., “Double Electron Ejection Resulting from Fhotoionization in the Outermost Shell of He, Ne and Ar, and Its Relationship in Electron Correlation,” Phys. Rev. 156, 142–154(1967).Google Scholar
14. Carlson, T. A., Moddeman, W. E. and Krause, M. O., “Electron Shakeoff in Neon and Argon as a Function of Energy of the Impact Electron,” Phys. Rev. A 1, 1406–1410 (1970).Google Scholar
15. Kennedy, D. J. and Manson, S. T., “Photoionization of the Noble Gases: Cross Sections and Angular Distributions,” Phys. Rev. A, 5., 227–247 (1972).Google Scholar
16. Wuiileumier, F., “Contribution à l'étude de la photoionisation des gaz rares par analyse continue entre 1,5 et 15 Å,” Thesis, Paris (1969), unpublished.Google Scholar
17. Krause, M. O., “Rearrangement of Inner Shell Ionized Atoms,” J. Phys. (Paris), 32, C4, 67–75 (1971).Google Scholar
18. Carlson, T. A., Krause, M. O. and Moddeman, W. E., “Excitation Accompanying Photoionization in Atoms and Molecules and Its Relationship to Electron Correlation,” J. Phys. (Paris), 32, C4, 76–84 (1971).Google Scholar
19. Henke, B. L., “The Measurement of Inner Shell Ionization Cross Sections for the 100-1000 eV Region as Involved with X-Ray and Electron Interactions Within Solids,” to be published in the Proceedings of the International Conference on Inner Shell Ionization Phenomena, April 1972, Atlanta, Georgia, USA.Google Scholar