Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-10T02:42:43.224Z Has data issue: false hasContentIssue false
  • English
  • Français

The Development of a Time-Resolved X-Ray Measurement System Using Imaging Plate

Published online by Cambridge University Press:  06 March 2019

Katsunari Sasaki ,
Hideto Yamazaki ,
Kenji Masuda  and
Ging-Ho Hsiue
Katsunari Sasaki
Affiliation:
Rigaku Corporation 3-9-12 Matsubara-cho Akishima-shi, Tokyo 196, Japan
Hideto Yamazaki
Affiliation:
Rigaku Corporation 3-9-12 Matsubara-cho Akishima-shi, Tokyo 196, Japan
Kenji Masuda
Affiliation:
Rigaku Corporation 3-9-12 Matsubara-cho Akishima-shi, Tokyo 196, Japan
Ging-Ho Hsiue
Affiliation:
Rigaku Corporation 3-9-12 Matsubara-cho Akishima-shi, Tokyo 196, Japan
Get access

Extract

A X-ray diffraction system using an Imaging Plate(IP) has been developed for time resolved X-ray measurements. The system consists of a new drum scanning type IP reader which includes a multiple time resolved X-ray exposure mechanism and a simple high temperature sample holder. Both are controlled from a personal computer. The new IP reader also supports 50μm/pixel reading for high resolution type IP (Blue IP), and has a spatial resolution better than 75μm.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 385 - 393
Copyright
Copyright © International Centre for Diffraction Data 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Y., Amemiya, K., Wakabayashi, T., Hamanaka, T., Wakabayashi, T., Matsushita, Hasegawa, H. Nucl. Instrum. Meth. 208, (1983), 471 Google Scholar
2. Hsiue, G.H., Hsieh, C.J., Hsu, C. S.. Makrom.chem. 191, (1990), 2195.Google Scholar
3. A., Shibata, K., Sasaki, Kinefuchi, T.. Advance in X-ray Analysis. Vol.35, (1992), 407.Google Scholar
4. K., Sasaki, K., Kakefuda, K., Masuda, Hsiue, G.H., Hsu, C. S.. Advance in X-ray Analysis. Vol.36, (1993), 387.Google Scholar