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Determining Stresses in Composites

Published online by Cambridge University Press:  06 March 2019

J. B. Cohen
J. B. Cohen*
Affiliation:
Department of Materials Science and Engineering McCormick School of Engineering and Applied Science Northwestern University Evanston, IL 60208
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Abstract

The basic diffraction techniques for examining the stress tensor are reviewed, with particular emphasis on what can be done without knowing the unstressed lattice parameter(s). Examples are given of the residual stresses in thin films, how to measure the bonding and yield stress in composites and separating the micro and macrostresses to examine load sharing between phases.

Type
VII. Stress Determination by Diffraction Methods
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 439 - 447
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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