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Determination of Thermal Expansion by High-Temperature X-Ray Diffraction

Published online by Cambridge University Press:  06 March 2019

Dale A. Vaughan  and
Charles M. Schwartz
Dale A. Vaughan
Affiliation:
Battelle Memorial Institute, Columbus, Ohio
Charles M. Schwartz
Affiliation:
Battelle Memorial Institute, Columbus, Ohio
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Abstract

Two high-temperature X-ray diffraction cameras are described which have been employed at Battelle to determine thermal expansion of metals and ceramic materials. Specimen preparation and temperature measurement and control are described. Lattice-parameter data vs. temperature are presented for uranium, uranium dioxide, and magnesium oxide.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961 , pp. 238 - 243
Copyright
Copyright © International Centre for Diffraction Data 1961

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References

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