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Determination of Dislocation Densities in Hexagonal Close-Packed Metals using X-Ray Diffraction and Transmission Electron Microscopy

Published online by Cambridge University Press:  06 March 2019

M. Griffiths ,
J.E. Winegar ,
J.F. Mecke  and
R.A. Holt
M. Griffiths
Affiliation:
AECL Research, Chalk River Laboratories Chalk River, Ontario, Canada K0J 1J0
J.E. Winegar
Affiliation:
AECL Research, Chalk River Laboratories Chalk River, Ontario, Canada K0J 1J0
J.F. Mecke
Affiliation:
AECL Research, Chalk River Laboratories Chalk River, Ontario, Canada K0J 1J0
R.A. Holt
Affiliation:
AECL Research, Chalk River Laboratories Chalk River, Ontario, Canada K0J 1J0
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Abstract

X-ray diffraction (XRD) line-broadening analysis has been used to determine dislocation densities in zirconium alloys with hexagonal closepacked (hep) crystal structures and a complex distribution of dislocations reflecting the plastic, anisotropy of the material. The validity of the technique has been assessed by comparison with direct measurements of dislocation densities in deformed polycrystalline and neutron-irradiated single crystal material using transmission electron microscopy (TEM). The results show that-there is good agreement between the XRD and TEM for measurements on the deformed material whereas there is a large discrepancy for measurements on the irradiated single crystal; the XRD measurements significantly underestimating the TEM observations.

Type
VIII. XRD Profile Fitting, Crystallite Size and Strain Determination
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 593 - 599
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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