Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-23T15:07:12.173Z Has data issue: false hasContentIssue false
  • English
  • Français

Determination of Boron Oxide in Glass by X-Ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

T. Arai ,
T. Sohmura  and
H. Tamenori
T. Arai
Affiliation:
Rigaku Industrial Corp., Osaka Japan
T. Sohmura
Affiliation:
Rigaku Industrial Corp., Osaka Japan
H. Tamenori
Affiliation:
Nippon Sheet Glass Co., LTD., Hyogo, Japan
Get access

Extract

In the last few years, at the Denver X-Ray Analytical Conference, the author and co-workers presented two papers which described the principle and applications of carbon analysis by X-ray fluorescence based upon a monochromatization technique consisting of total reflection and filtering. Instead of the wavelength dispersive method based on Bragg reflection, this monochromatization, combining total reflection by a selected mirror and an appropriate filter, offered an alternative approach for the purpose of increasing measured X-ray intensity. The analytical performance of quantitative determination of carbon content in steel, cast iron and coal were reported.

Type
VIII. XRF General Applications
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 423 - 430
Copyright
Copyright © International Centre for Diffraction Data 1982

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1) Asai, T., Japanese J. Appl. Phys. vol. 21 (1982) p. 1347 Google Scholar
2) Janiak, M. J., Utaka, T. and Arai, T., 28th Denver X-Ray Conference (1970)Google Scholar
3) Janiak, M. J., Funahashi, M. and Arai, T., 29th Denver X-Ray Conference (1980)Google Scholar
4) Henke, B. L., Phys. Rev. vol. 6 (1972),p. 94 Google Scholar
5) Henke, B. L. and Ebisu, E. S., Advances in X-Ray Analysis vol. 17 (1974), p. 150 Google Scholar
6) Henke, B. L. and Schattenburg, M. L. Advances in X-Ray Analysis, vol. 19 (1976), p. 749 Google Scholar
7) Lukirskii, A. P., Svinov, E. P., Ershov, O. A. and Shepelev, Yu. F., Opt. & Spectrosk (*USSR) vol. 16 (1964), p. 186 Google Scholar