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Crystal Subgrain Misortentations Via X-ray Diffraction Microscopy

Published online by Cambridge University Press:  06 March 2019

R. W. Armstrong
Affiliation:
University of Maryland, College Park, Maryland, 20742; and, E. N. Farabaugh, National Bureau of Standards, Washington, D. C., 20234 (C. Cm. Wu is currently on leave at the Naval Research Laboratory, Washington, D. C., 20375.)
C. Cm. Wu
Affiliation:
University of Maryland, College Park, Maryland, 20742; and, E. N. Farabaugh, National Bureau of Standards, Washington, D. C., 20234 (C. Cm. Wu is currently on leave at the Naval Research Laboratory, Washington, D. C., 20375.)
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Abstract

The “misorientation. contrast” which occurs at boundaries marking the relative displacement of adjacent subgrain reflections in x-ray diffraction images is shown by a stereographic projection method of analysis to be useful for deciphering x-ray images obtained by the Berg-Barrett and Lang techniques. Experimental results are given for subgrain structures observed in Zn and A1203 crystals.

Type
X-Ray Topography
Copyright
Copyright © International Centre for Diffraction Data 1976

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References

1. Berg, W. F., “ÜbereinerontgenographischeMethodezurUntersuchung vonGitterstörungen an Kristallen,” Naturwissenschaften 19, 391396 (1931).Google Scholar
2. Barrett, C. S., “A New Microscopy and Its Potentialities,” Trans. AIME 161, 1564 (1945).Google Scholar
3. Schulz, L. G., “Method of Using a Fine Focus X∼ray Tube for Examining the Surface of Single Crystals,” J. Met. 1082-1083 (1954).Google Scholar
4. Wu, C. Cm. and Armstrong, R. W., “Misorientation Contrast of Crystal Subgrain Boundaries in Berg-Barrett X-ray Micrographs,” J. Appl. Cryst.8, 2936 (1975).Google Scholar
5. Wu, C. Cm. and Armstrong, R. W., “Quantitative Analysis of Subgrain Misorientations Observed in Berg-Barrett X-ray Micrographs,” Phys. Stat. Sol, (a)29, 259263 (1975).Google Scholar
6. Farabaugh, E. N., Ph.D. Thesis Research, University of Maryland (1976).Google Scholar
7. Farabaugh, E. N. and Wu, C. Cm., “Characterization of Growth Defects within a Vapor Grown Sapphire Crystal via the Lang X-ray Technique” Amer. Conf. on Crystal Growth, ACCG III, p. 116117, Stanford, California (1975).Google Scholar
8. Farabaugh, E. H., Parker, H. S., and Armstrong, R. W., “Skew-Reflection X-ray Microscopy of the Vapor Growth Surface of an Al 2O3 Single Crystal,“ J. Appl. Cryst. 6, 482486 (1973).Google Scholar
9. Lang, A. R. and Polcarova, M., “X-Ray Topographic Studies of Dislocations in Iron-Silicon Alloy Single Crystals,” Proc. Roy. Soc. London A 285, 297311 (1965).Google Scholar
10. Armstrong, R. W. and Wu, C. Cm., “X-Ray Diffraction Microscopy,” in McCall, J. L. and Mueller, W. M., Editors, “Microstructural Analysis: Tools and Techniques,” p.169219, Plenum Press (1973).Google Scholar