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Crystal Subgrain Misortentations Via X-ray Diffraction Microscopy

Published online by Cambridge University Press:  06 March 2019

R. W. Armstrong  and
C. Cm. Wu
R. W. Armstrong
Affiliation:
University of Maryland, College Park, Maryland, 20742; and, E. N. Farabaugh, National Bureau of Standards, Washington, D. C., 20234 (C. Cm. Wu is currently on leave at the Naval Research Laboratory, Washington, D. C., 20375.)
C. Cm. Wu
Affiliation:
University of Maryland, College Park, Maryland, 20742; and, E. N. Farabaugh, National Bureau of Standards, Washington, D. C., 20234 (C. Cm. Wu is currently on leave at the Naval Research Laboratory, Washington, D. C., 20375.)
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Abstract

The “misorientation. contrast” which occurs at boundaries marking the relative displacement of adjacent subgrain reflections in x-ray diffraction images is shown by a stereographic projection method of analysis to be useful for deciphering x-ray images obtained by the Berg-Barrett and Lang techniques. Experimental results are given for subgrain structures observed in Zn and A1203 crystals.

Type
X-Ray Topography
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 201 - 206
Copyright
Copyright © International Centre for Diffraction Data 1976

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References

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