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Contrast of Dislocation Images in X-Ray Transmission Topography

Published online by Cambridge University Press:  06 March 2019

A. Authier*
Affiliation:
Laboratoire de Minéralogie-Cristallographie Paris, France
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Abstract

A brief review of the different topographic methods is given in order to attempt a classification of the various types of contrast observed. Depending on whether the image is obtained by a reflection or transmission method, is simple or integrated, dynamic, direct, or intermediary, the contrast and image width vary greatly. A detailed analysis is given in the case of transmission section topographs.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1966

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References

1. Newkirk, J. B., Trans. AIME 215: 483, 1959.Google Scholar
2. Lang, A. R., J. Appl. Phys. 29: 597, 1958.Google Scholar
3. Lang, A. R., Acta Cryst. 12: 249, 1959.Google Scholar
4. Borrmann, G., Hartrwig, W., and Irmler, H., Z. Naturforsch. 13a: 423, 1958.Google Scholar
5. Bonse, U. and Kappler, E., Z. Naturforsch. 13a: 348, 1958.Google Scholar
6. Reimmger, M., Phys. Letters 1: 104 and 106, 1962.Google Scholar
7. Kohra, K., Yoshimatsu, M., and Shimzu, J., Direct Observations of Imperfections in Crystals, Interscience Publishers, New York, 1962, p. 461.Google Scholar
8. Authier, A., J. Phys. Radium 21: 655, 1960.Google Scholar
9. Barth, H. and Hosemann, R., Z. Naturforsch. 13a: 792, 1958.Google Scholar
10. Gerold, V. and Meier, F., Z. Physik 155: 387, 1959.Google Scholar
11. Newkirk, J. B., Bonse, U., and Hart, M., this volume, pp. 1-8.Google Scholar
12. Authier, A., Informal Meeting on Dynamical Theory, Munich, 1962.Google Scholar
13. Authier, A., Bull. Soc. Franc. Mineral. Crist. 84: 51, 1961.Google Scholar
14. Lang, A. R. and Polcarova, M., Proc. Roy. Soc. (London) A235: 297, 1965.Google Scholar
15. Authier, A. and Petroff, J. F., Compt. Rend. 258: 4238, 1964.Google Scholar
16. Lang, A. R., Z. Naturforsch. 20a: 636, 1965.Google Scholar
17. Willaime, C. and Authier, A., Bull. Soc. Franc, Mineral. Crist. 89: 279, 1966.Google Scholar
18. Chikawa, J., Appl. Physics Letters 4: 154, 1964.Google Scholar
19. Schlangenotto, H., Z. Physik 171: 537, 1963.Google Scholar
20. Siems, R., private communication, 1965.Google Scholar
21. Eshelby, J. D., Read, W. T., and Shockley, W., Acta Met. 1: 251, 1953.Google Scholar
22. Borrmann, G., Physik. Bl. 15: 508, 1959.Google Scholar
23. Authier, A., Bull. Soc. Franc. Mineral. Crist. 84: 115, 1961.Google Scholar
24. Ishii, Z., J. Phys. Soc. Japan 17: 838, 1962.Google Scholar
25. Penning, P. and Polder, D., Philips Res. Rpt. 16: 419, 1961.Google Scholar
26. Authier, A. and Malgrange, C., Compt. Rend. 262: 429, 1966.Google Scholar
27. Meier, F., Z. Physik 168: 10 and 29, 1962.Google Scholar
28. Hart, M., Ph.D. Thesis, Bristol University, 1963.Google Scholar
29. Young, F., Advances in X-Ray Analysis, Vol. 9, Plenum Press, New York, 1965, pp. 113.Google Scholar
30. Kambe, K., Z. Naturforsch. 18a: 1010, 1963.Google Scholar
31. Taupin, D., Bull. Soc. Franc. Mineral. Crist. 87: 469, 1964.Google Scholar
32. Malgrange, C. and Dumesnil, F., 7th Int. Congr. Cryst., Moscow, 1966.Google Scholar
33. Takagi, S., Acta Cryst. 15: 1311, 1962.Google Scholar
34. Borrmann, G., private communication, 1962.Google Scholar
35. Penning, P., Colloque de l'Association Française de Cristallographie, Nancy, 1964.Google Scholar
36. Penning, P., Thesis, Delft, 1966.Google Scholar
37. Kato, N., Uaami, K., and Katagawa, T., this volume, pp. 46-66.Google Scholar
38. Authier, A. and Sauvage, M., J. Phys. Radium 27: C3-137, 1966.Google Scholar
39. Kato, N., J. Phys. Soc. Japan 19: 971, 1964.Google Scholar
40. Kato, N. and Ando, Y., J. Phys. Soc. Japon 21: 964, 1966.Google Scholar
41. Authier, A. and Lang, A. R., J. Appl. Phys. 35: 1956, 1964.Google Scholar
42. Petroff, J. F. and A. Authier, Phys. Status Solidi 17: K3, 1966.Google Scholar
43. Authier, A., J. Phys. Radium 27: 57, 1966.Google Scholar
44. Alexandrov, K. S. and Ruzhova, T. V., Iz. Akad. Nauk SSSR Ser. Geofiz. 12: 1799, 1961.Google Scholar