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Comparison of Residual Stress Measurement and Breaking Strength on Alumina Rods

Published online by Cambridge University Press:  06 March 2019

D. J. Snoha ,
C. O. Ruud  and
H. D. Cassel
D. J. Snoha
Affiliation:
Materials Research Laboratory The Pennsylvania State University University Park, PA 16802
C. O. Ruud
Affiliation:
Materials Research Laboratory The Pennsylvania State University University Park, PA 16802
H. D. Cassel
Affiliation:
Materials Research Laboratory The Pennsylvania State University University Park, PA 16802
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Abstract

X-ray diffraction (XRD) utilizing copper K-alpha radiation and the single exposure technique (SET) was used for residual stress measurement on two different thermal treatments of Al-300 alumina rods. The measurements were performed in the axial and tangential directions on forty halves of twenty broken rods. The twenty rods were intially annealed for 8 hours at 1000°C; then ten were slow cooled and ten were equilibrated at 1450°C then force-air quenched. A fine mesh sapphire (alumina) powder was used as a zero stress standard for the determination of calibration validity of the position sensitive scintillation detector based (PSSD) stress measuring instrument used for this study. This instrument was developed at the Materials Research Laboratory of The Pennsylvania State University.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 29: Thirty-Fourth Annual Conference on Applications of X-ray Analysis, August 5-9, 1985 , 1985 , pp. 43 - 48
Copyright
Copyright © International Centre for Diffraction Data 1985

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References

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