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A Comparison of Four Slit Apertures for Selected-Area Analysis with the X-Ray Secondary-Emission Spectrometer

Published online by Cambridge University Press:  06 March 2019

Eugene P. Bertin
Eugene P. Bertin*
Affiliation:
Radio Corporation of America Harrison, New Jersey
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Abstract

Four types of slit apertures—vertical, horizontal, inclined, and sirtgle-edge—for selected-area analysis with commercial X-ray secondary-emission (fluorescence) spectrometers are described, evaluated, and compared. The vertical and single-edge slits already have been described by the writer and Rizzo. The other two are described here for the first time. The vertical and horizontal slits are secondarybeam apertures; the other two lie in both the primary and secondary beams. AH the slits are mounted on the specimen drawer. No further modification of the spectrometer is required except replacement of the soller collimators with open tunnels or simple slits, and replacement of the flat crystal with a fixed-radius curved crystal to increase sensitivity. The accessories are inexpensive and can be made in even a modest machine shop. They can be installed on or removed from the spectrometer in about 5 min. The accessories are applicable ordy to linear selected areas where composition varies in the direction normal to but not along the line, for example, linear inclusions and sections of plated surfaces, diffusion couples, and interfaces. The four slits were evaluated and compared for resolution, sensitivity, and spectral-line width. Techniques for use, advantages, limitations, and means for improvement are discussed for each of the slits. The horizontal slit is of little value, but each of the others has features which permit analysis of very narrow selected areas for which pinhole apertures would not be sufficiently sensitive. Slit widths as narrow as 0,00012 in. (0.003 mm) have been used in favorable cases. The inclined slit, used with a pulse-height analyzer, is probably the most useful of the four apertures, combining high sensitivity, high resolution, and narrow spectral-line width.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 10: Fifteenth Annual Conference on Applications of X-ray Analysis, August 10-12, 1966 , 1966 , pp. 462 - 473
Copyright
Copyright © International Centre for Diffraction Data 1966

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References

1. Bertin, E. P., “Evaluation and Application of an Improved Slit Probe for the X-Ray Sscondary- Emission Spectrometer,” Advances in X-Ray Analysis, Vol. 8, Plenum Press, New York, 1965, pp. 231–246.Google Scholar
2. Rizzo, F. E., “Diffusion of Electroplated Couples,” Ph.D. Thesis, University of Cincinnati, 1964.Google Scholar
3. Dunne, J. A., “A New Focusing Vacuum X-Ray Macroprobe Analyzer,” Advances in X-Ray Analysis, Vol. 8, Plenum Press, New York, 1965, pp. 223–230.Google Scholar
4. Johnson, M. P., Beeley, P. R., and Nutting, J., “Application of X-Ray Fluorescence Probe Analysis to the Study of Segregation in Steels,” ibid., pp. 259-268.Google Scholar
5. Storks, K. H. and Loomis, T. C., unpublished work.Google Scholar
6.Philips Electronic Instruments, Inc., 750 South Fulton Ave., Mt. Vernon, New York, 10550, commercial literature.Google Scholar
7. Bertin, E. P. and Longobucco, R. J., “X-Ray Spectrometric Determination of Composition and Distribution of Sublimates in Receiving-Type Electron Tubes,” Advances in X-Ray Analysis, Vol. 7, Plenum Press, New York, 1964, pp. 566–583.Google Scholar
8. Heinrich, K. F. J., “X-Ray Probe with Collimation of the Secondary Beam,” ibid., Vol. 5, 1962, pp. 516-526.Google Scholar
9. Lynch, J. T., “X-Ray Techniques as a Tool to Analyze Intermetallic Coatings,” Plating 51: 1173–1177, 1964.Google Scholar
10. Miller, D. C., “Norelco Pinhole Attachment,” Advances in X-Ray Analysis, Vol. 4, Plenum Press, 1961, pp. 513–520.Google Scholar
11. Sloan, R. D., “X-Ray Spectrographic Analysis of Thin Films by the Milliprobe Technique,” ibid., Vol. 5, 1962, pp. 512-515.Google Scholar
12. Togel, K., “X-Ray Fluorescence Analysis of Small Quantities and Areas,” Siemens-Z. 36: 497–501, 1962.Google Scholar
13. Weyl, R., “Nondestructive Measurement of Composition and Thickness of Thin Layers by X-Ray Fluorescence,” Z. Angela. Phys. 13: 283–288, 1961.Google Scholar
14. Wittig, W. J., “Use of an X-Ray Fluorescence Semimicroprobe Attachment in Metallurgy,” Advances in X-Ray Analysis, Vol. 8, Plenum Press, New York, 1965, pp. 248–258.Google Scholar
15. Zimmerman, R. H., “Industrial Applications of X-Ray Methods for Measuring Plating Thickness,” ibid., Vol. 4, 1961, pp. 335-350.Google Scholar
16. Bertin, E. P., “X-Ray Probe with. Slit Aperture in the Secondary Beam,” Anal. Chem. 36: 441–443, 1964.Google Scholar
17. Rizzo, F. E., Westerman, F., and McDuffie, R., “Determination of Concentration Profiles by X-Ray Emission,” Denver Conf. Applications X-Ray Anal., 1965.Google Scholar
18.General Electric Co., X-Ray Dept.,4855 Electric Ave., Milwaukee, Wisconsin, 53201, Bulletin 8A-3S62, 1962.Google Scholar
19. Rizzo, F. E., private communication.Google Scholar