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Comparison of Experimental Techniques to Improve Peak to Background Ratios in X-ray Powder Diffractometry

Published online by Cambridge University Press:  06 March 2019

William K. Istone ,
John C. Russ  and
William D. Stewart
William K. Istone
Affiliation:
Champion International.Corp., West Nyack, NY
John C. Russ
Affiliation:
North Carolina State University, Raleigh, NC
William D. Stewart
Affiliation:
Dapple Systems, Sunnyvale, CA
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Abstract

High peak to background ratios are especially important in powder diffractometry when attempting to identify minor phases in a sample or improving the limit of detection in quantitative determinations. Instrumental techniques to improve peak to background generally involve the employment of monochromatic or partially monochromatic radiation through the use of filters, crystal monochrometers, or pulse height discriminators.

In this study, a digital pulse height discriminator, configured as a card in a personal computer (Apple IIe) with appropriate software, is used in conjunction with a scintillation detector to improve peak to background ratios. The software allows the pulse height distribution to be scanned and the optimum pulse height window to be set for a given set of sample and instrumental conditions. Results obtained by this technique are directly compared with results obtained using a pyrolytic graphite monochrometer and beta filters. Examples cited include qualitative phase identification in both fluorescent and non-fluorescent samples and semi-micro quantitative analysis (determination of airborne silica).

Type
IX. Qualitative and Quantitative Phase Analysis Diffraction Applications
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 601 - 607
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

1. Klug, H.P. and Alexander, L.E., “X-Ray Diffraction Procedures,” John Wiley and Sons, Inc. , New York (1954)Google Scholar
2. Bertin, E.P., “Principles and Practice of X-Ray spectrometric Analysis,” Plenum Press, New York (1975)Google Scholar
3. Jenkins, R. and de, J.L. Vries, “X-Ray Powder Diffractometry,” Philips, N.V., Eindhoven (1970)Google Scholar
4. Moori, T. et al, Yogyo Kyokai Shi, 78(904), pp 396–400, (1970)Google Scholar
5. Delaney, I.J. and Standen, M.E., Inst. Mining Met. , Trans. , Sect C, 79 (Sept), pp 234–237, (1970)Google Scholar