Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-23T12:55:53.529Z Has data issue: false hasContentIssue false

A Combined Derivative Method for Peak Search Analysis

Published online by Cambridge University Press:  06 March 2019

T. C. Huang
Affiliation:
IBM Research Laboratory, 5600 Cottle Road, San Jose, CA. 95193
W. Parrish
Affiliation:
IBM Research Laboratory, 5600 Cottle Road, San Jose, CA. 95193
Get access

Abstract

A comprehensive study of derivative methods for the peak search analysis of X-ray diffraction data was made to determine the relative merits of the methods. The peak positions were best determined by the cubic first derivative method which had an intrinsic error ≤ 0.001°, and random error ∼ ± 0.003 ° to 0.02 ° depending on the counting statistical noise. The quadratic/cubic second derivative method had the highest resolution with a separation limit ≥ 1/2w (w = full width at half maximum). An effective algorithm combining the cubic first derivative and the quadratic/cubic second derivative methods was developed for high precision and resolution. The method uses a full screen menu for parameter selection, and the entire peak search analysis including peak identification and position determination, and graphic and numeric display of results at the color terminal is completed in a few seconds using a time sharing mode on an IBM 3083 central processing unit. The combined derivative method should be also applicable to other spectra such as gamma-rays, X-ray fluorescence, optical, infrared, ESCA, Mossbauer, etc.

Type
I. J. D. Hanawalt Award Session on Search/Match Methods
Copyright
Copyright © International Centre for Diffraction Data 1983

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Sonneveld, E. J. and Visser, J. W., Automatic Collection of Powder Data from Photographs, J. Appl. Cryst. 8:1 (1975).Google Scholar
2. Naidu, S. V. N. and Houska, C. R., Profile Separation in Complex Powder Patterns, J. Appl. Cryst. 15:190 (1982). (Due to limited space, only one of the earliest and one of the recent papers related to peak search by derivative method are listed here).Google Scholar
3. Parrish, W., Ayers, G. L. and Huang, T. C., Computer Simulation of Powder Patterns, Adv. X-Ray Anal. 27 (1984).Google Scholar
4. Savitzky, A. and Golay, J. E., Smoothing and Differentiation of Data by Simplified Least Squares Procedures, Anal. Chem. 36:1627 (1964).Google Scholar
5. Parrish, W., “X-Ray Analysis Papers”, Centrex Publishing Co., Eindhoven (1965).Google Scholar
6. Huang, T. C., Parrish, W. and Lim, G., Experimental Study of Precise Peak Determination in Powder Diffraction, Adv. X-Ray Anal. 27 (following paper) (1984).Google Scholar