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Characterization of Thin Films Using XRF

Published online by Cambridge University Press:  06 March 2019

James E. Willis
James E. Willis*
Affiliation:
Data Acquisition and Control, Inc, P.O. Box 779 Roswell, GA 30077
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Extract

Thin film samples represent ideal samples for analysis using X-ray fluorescence in that they tend to be flat, smooth and homogeneous. However, before a sample can be characterized using XRF, several questions must be answered.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 189 - 195
Copyright
Copyright © International Centre for Diffraction Data 1989

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References

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