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Characterization of Lattice Defects and Concomitant Strain Distribution

Published online by Cambridge University Press:  06 March 2019

Sigmund Weissmann
Sigmund Weissmann*
Affiliation:
Department of Materials Science and Engineering College of Engineering, Rutgers University Piscataway, NJ 08855, USA
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Abstract

A number of X-ray methods characterizing lattice defects are described. They were developed in response to a variety of challenging problems in materials science, A method based on a computer-aided rocking curve analysis, CARCA, was developed which offers a rapid mapping of the dislocation structure in an epitaxial film, as well as a tensor analysis of nonuniform elastic strains. Characterization methods were developed in an attempt at bridging, systematically, the gap between micro and macromechanics when the problem arose to clarify the distribution of elastic strains emanating from stress concentrators such as notches, cracks, holes and to elucidate strain interactions. Gradients of elastic strains were characterized by a method of local intensity measurements. For crystal with homogeneous elastic strain distribution a tensor analysis is described, based on precision measurements obtained by the backreflection divergent beam method. A direct linkage between the imaging of the micro structure by TEM and the macro-response of deformation and recovery of commercial alloys was achieved by a version of the CARCA method, designed to characterize the lattice defects in polycrystalline materials. Example applications of the methods are presented with the hope that their usefulness may find adaptations in other areas of investigation.

Type
IV. Lattice Defects and X-Ray Topography
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 221 - 237
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Lo, C.F., Kamide, H., Feng, G.F., Mayo, W.E. and Weissmann, S., Acta Metall. 36: 3069 (1988).Google Scholar
2. Lo, C.F., Feng, G.F., Mayo, W.E. and S, Weissmann, Deformation, Recovery and Stress Corrosion Cracking in Nickel-Base Alloy 600 by X-ray Rocking-curve Measurements in “Advances in X-ray Analysis,” Vol. 33, C.S, Barrett et al. eds., Plenum, New York (1990).Google Scholar
3. Pangborn, R.N., S, Weissmann, and Kramer, I.R., Met. Trans. 12A: 109 (1981).Google Scholar
4. Mayo, W.E. and Weissmann, S., Computer Aided Defect Mapping in “Applications of X-ray Topographic Methods,” Weissmann, S. et al. eds., Plenum, New York (1984).Google Scholar
5. Takemoto, T., Weissmann, S., and I.R, Kramer, Determination of Prefracture Damage and Failure Prediction in Corrosion—Fatigued A1-2024-T4 by X-ray Diffraction Methods in “Fatigue, Environment and Temperature Effects,” J.J. Burke and V, Weiss, eds, Plenum, New York (1983).Google Scholar
6. Imura, T., Weissmann, S., and Slade, J.J. Jr., Acta Cryst. 15: 786 (1962).Google Scholar
7. Slade, J.J., Weissmann, S., Nakajima, K., and Harabayashi, J. Appl. Phys. 35: 3373 (1964).Google Scholar
8. Kalman, Z.H., Lee, L.H., He, X.C. and Weissmann, S., Met. Trans. 19A: 217 (1988).Google Scholar
9. Chaudhuri, J., Kalman, Z.H., Weng, G.J., and Weissmann, S., J. Appl. Cryst, 15: 423 (1982).Google Scholar
10. Liu, H.Y., Weng, G.J. and Vfeissstann, S., J. Appl. Cryst. 15: 594 (1982).Google Scholar
11. Liu, H.Y., Mayo, W.E., and Weissmann, S., Mat. Sci. and Eng. 63: 81 (1984).Google Scholar
12. Schutz, R.J., Testardi, L.R., and Weissmann, S., J. Appl. Phys. 52: 5501 (1981).Google Scholar
13. Lalevic, B., Murty, K., Ito, T., Kalman, Z.H. and Weissmann, S., J. Appl. Phys. 52: 4808 (1981).Google Scholar
14. Mayo, W.E., Chaudhuri, J. and Weissmann, S., Residual Strain Measurements in Microelectronic Materials, in “Nondestructive Evaluation—Application to Materials Processing,” O. Euck and Wolf, S.M., eds., ASM, Metals Park, OH (1984).Google Scholar
15. Yacizi, R. and Weissmann, S., “Microplasticity Contour Mapping of Notched 304 Stainless Steel by the X-ray CARCA Methoc” in Conf. Proc. of Fracture: Measurement of Localised Deformation by Novel Techniques, Gerberich, W.W. and D,L. Davidson, eds, M, Met. Soc. AIME Fall Meeting, Detroit, MI (1984).Google Scholar
16. Neuber, H, Kerbspannungslehre, pp. 58-111, Springer, Berlin, 1958 (Engl, Transl.: Edwards Broth., Ann Arbor, MI).Google Scholar
17. Goritskii, V.S., Ivanova, L.S., and Teren, J. F. EV, Sov. Phv. Doklady. 17: 776 (1973).Google Scholar
18. Tabata, T. and Fujita, H., J. Phys. Soc. Jap. 32: 1536 (1972).Google Scholar
19. Kalman, Z,H. and Weissmann, S., J. Appl. Cryst. 16: 295 (1983).Google Scholar
20. Kalman, Z.H., Chaudhuri, J., Weng, G.J. and S, Weissmann, J. Appl. Cryst. 13: 290 (1980).Google Scholar
21. Weissmann, S., V.A, Greenhut, Chaudhuri, J. and Z.H, Kalman, J. Appl. Cryst. 16: 606 (1983).Google Scholar
22. Kalman, Z.H. and Weissmann, S., J. Appl. Cryst. 12: 209 (1979).Google Scholar
23. Schutz, R.J., Testardi, I.R., and Weissmann, S., J. Appl. Phys. 52: 5496 (1981),Google Scholar
24. Schutz, R.J., Weissmann, S. and Yaniero, J., J. Appl. Cryst. 14: 352 (1981).Google Scholar
25. Yacizi, R., W.E, Mayo, T, Takemoto and Weissmann, S., J. Appl. Cryst. 16: 89 (1983).Google Scholar
26. Smidoda, K., Gottschalk, C., and Gleiter, B., Wet. Sci. 13: 146 (1979).Google Scholar