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A Camera for Borrmann Stereo X-Ray Topographs

Published online by Cambridge University Press:  06 March 2019

F. W. Young Jr.
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
T. O. Baldwin
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
A. E. Merlini
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
F. A. Sherrill
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
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Abstract

A relatively inexpensive camera which was designed for taking Borrmann topographs with standard X-ray diffraction equipment is described. This camera has been used to take stereo pairs of Borrmann topographs by rotating the crystal around an axis normal to the diffraction planes. Topographs have been taken of nearly perfect copper crystals up to 0.2 cm thick using silver, molybdenum, copper, and chromium radiation, and comparisons have been made with topographs obtained with crystal monochromated radiation. Geometrical factors affecting the resolving power of the technique are briefly reviewed. In addition, the resolution inherent in the diffraction phenomenon is analyzed on the basis of the theory of anomalous transmission. Comparisons are made between calculated and observed image widths of a few dislocations.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1965

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