Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-23T11:43:46.744Z Has data issue: false hasContentIssue false
  • English
  • Français

Applications of a New Multielement Portable X-Ray Spectrometer to Materials Analysis

Published online by Cambridge University Press:  06 March 2019

C. von Alfthan ,
P. Rautala  and
J. R. Rhodes
C. von Alfthan
Affiliation:
Outokumpu Oy, Espoo, Finland
P. Rautala
Affiliation:
Outokumpu Oy, Espoo, Finland
J. R. Rhodes
Affiliation:
Columbia Scientific Industries, Austin, Texas 78766
Get access

Abstract

A new hand-portable, microprocessor-based, multielement X-ray fluorescence analyzer is described. The instrument is light in weight (19 1b), completely self-contained and powered by internal rechargeable batteries. The detector is a special proportional counter whose room temperature energy resolution is sufficient to enable adjacent element X-rays to be deconvoluted with the help of the microprocessor. The instrument yields concentration readout of elements, corrected for matrix effects, in groups of four at a time. A number of field and laboratory applications to ore, solution and alloy analysis are described.

Type
XRF Applications in the Minerals Industry
Information
Advances in X-Ray Analysis , Volume 23: Twenty-Eighth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1979 , 1979 , pp. 27 - 36
Copyright
Copyright © International Centre for Diffraction Data 1979

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Bowie, S. H. U., Darnley, A. G. and Rhodes, J. R., Trans. Instn. Mining Met. 74 361 (1965).Google Scholar
2. Rhodes, J. R., Analyst 91, 683 (1966).Google Scholar
3. Rhodes, J. R. and Furuta, T. in “Advances in X-Ray Analysis”, Vol. II, Eds. Newkirk, John B., Mallett, Gavin R. and Pfeiffer, Heinz G., 249, Plenum Press, New York (1968).Google Scholar
4. Lehto, J., I.E.E.E. Trans. Nucl. Sci., NS-25, 777 (1978).Google Scholar
5. Hietala, M. and Viitanen, J. in “Advances in X-Ray Analysis”, Vol. 21, Eds. Barrett, C. S., Leyden, D. E., Newkirk, J. B. and Ruud, C. O., 193, Plenum Press, New York (1978).Google Scholar
6. Sipila, H. and Kiuru, E., loc cit, 187.Google Scholar