Hostname: page-component-cd9895bd7-gxg78 Total loading time: 0 Render date: 2024-12-25T02:26:11.359Z Has data issue: false hasContentIssue false
  • English
  • Français

The Application of Scanning Electron Microscopy and Energy Dispersive X-Ray Analysis to the Examination of Forensic Paint Samples

Published online by Cambridge University Press:  06 March 2019

R. Wilson  and
G. Judd
R. Wilson
Affiliation:
Rensselaer Polytechnic Institute, Troy, New York 12181
G. Judd
Affiliation:
Rensselaer Polytechnic Institute, Troy, New York 12181
Get access

Abstract

Electron optics techniques have been applied to the examination of various evidence materials common to forensic science. Vehicular paint fragments, a common evidence material, possess topographical features suitable for SEM analysis and composition variations in the form of chemically distinct layers and surface contaminant particles which can be characterized using energy dispersive X-ray analysis. The ability to analyze paint samples in terms of both topography and composition presents the potential of an extremely valuable tool for forensic investigators.

Over thirty automotive paint samples from many sources were examined in this study, using either the secondary electron image of the SEM or the SEM image combined with concurrent X-ray analysis by an energy dispersive System. Topographical pictures and X-ray spectra were recorded and comparisons between samples were made. Additional characterization of specimens was attempted through the analysis of individual paint layers.

The data obtained was used to group the paint samples into categories used for identification of the sample source. This information is valuable to several types of criminal investigation.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 16: 'Twenty-First Annual Conference on Applications of X-ray Analysis, August 2-4, 1972 , 1972 , pp. 19 - 26
Copyright
Copyright © International Centre for Diffraction Data 1972

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Devaney, J. R. and Bradford, L. W., “Applications of Scanning Electron Microscopy to Forensic Science at Jet Propulsion Laboratory, 1969-1970”, Fourth IITRI Symposium, 561–568 (197l).Google Scholar
2. Grove, C. A., Judd, G. and Horn, R., “Examination of Firing Pin Impressions by Scanning Electron Microscopy”, Journal of Forensic Science (to be published October 1972).Google Scholar
3. MacDonnell, H. L. and Pruden, L. H., “Application of the Scanning Electron Microscope to the Examination of Firearms Markings”, Fourth IITRI Symposium, 569–576 (1971).Google Scholar
4. Williams, R. L., “An Evaluation of the SEM with X-ray Microanalysis Accessory for Forensic Work”, Fourth IITRI Symposium., 537–544, (1971).Google Scholar
5. MacQueen, H. R., Judd, G., and Ferriss, S., “The Application of Scanning Electron Microscopy to the Forensic Evaluation of Vehicular Paint Samples”, Journal of Forensic Sciences (to be published, Octoher 1972).Google Scholar
6. Siegemund, K. A. and Hunter, G. M., “Scanning Electron Microscopy of Selected Crime Laboratory Specimens”, Fourth IITRI Symposium, 577–584 (1971).Google Scholar
7. Taylor, M. E., “Forensic Applications of Scanning Electron Microscopy”, Fourth IITRI Symposium, 585–586 (1971).Google Scholar
8. Rodgers, P. G., Jacob, J. R. G., Blais, P., and Harris, D. C., “The Scanning Electron Microscopy of Counterfeit Coins”, Fourth IITRI Symposium. 585–586 (l97l).Google Scholar
9. Boehm, E., “Applications of the SEM in Forensic Medicine”, Fourth IITRI Symposium, 553–562 (1971).Google Scholar