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Application of Multilayer Analyzers to 15-150 Å Fluorescence Spectroscopy for Chemical and Valence Band Analysis

Published online by Cambridge University Press:  06 March 2019

Burton L. Henke*
Affiliation:
Pomona College, Claremont, California
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Abstract

Methods and instruments have been developed for efficient spectroscopic analysis in the 15 to 150 Å ultrasoft X-ray legion using specially designed Langmuir-Blodgett type multilayer analyzers with a flow proportional counter detection system. Simple adaptations of the basic Philips vacuum spectrograph are employed with a high-intensity, demountable, ultrasoft X-ray source to excite fluorescence in the lighter elements for chemical and valence band analysis.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1965

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References

1. Henke, B. L., “Production, Detection and Application of Ultrasoft X-Rays,” X-Ray Optics and X-Ray Microanalysis, Academic Press, Inc., New York, 1964, p. 157.Google Scholar
2. Henke, B. L., “Sodium and Magnesium Analysis—Method,” Advances in X-Ray Analysis, Vol. 6, Plenum Press, New York, 1963, p. 361.Google Scholar
3. Henke, B. L., “X-Ray Fluorescence Analysis for Sodium, Fluorine, Oxygen, Nitrogen, Carbon and Boron,” Advances in X-Ray Analysis, Vol. 7, Plenum Press, New York, 1964, p. 469.Google Scholar
4. Henke, B. L., “Some Notes on Ultrasoft X-Ray Analysis—10 to 100 A Region,” Advances in X-Ray Analysis, Vol. 8, Plenum Press, New York, 1965, p. 269.Google Scholar
5. Eaird, A. K. and Henke, B. L., “Oxygen Determination in Silicates and Major Elemental Analysis of Rocks by Soft X-Ray Spectrometry,” Anal. Chem. 37: 727, 1965.Google Scholar
6. Nicholson, J., “The Effect of Grating Blaze Angle on the Reflection of Ultrasoft X-Ray Radiation,” Advances in X-ray Analysis, Vol. 8, Plenum Press, New York, 1965, p. 301.Google Scholar
7. Skinner, H. W. B., “The Soft X-ray Spectroscopy of the Solid State,” Rept. Progr. Phvs. 5: 257, 1939.Google Scholar
8. Skinner, H. W. B., “The Soft X-Ray Spectroscopy of Solids. I. K.- and L-Emission Spectra from Elements of the First Two Groups,” Trans. Roy. Soc, A 239: 95, 1940.Google Scholar
9. O'Bryan, H. M. and Skinner, H. W. E., “The Soft X-Ray Spectroscopy of Solids. II. Emission Spectra from Simple Chemical Compounds,” Proc. Roy. Soc. (London), Ser. A 176: 229, 1940.Google Scholar
10. Tomboulian, D. H., “The Experimental Methods of Soft X-Ray Spectroscopy and the Valence Band Spectra of the Light Elements,” Handbuch der Pkysik 30: 246, 1957.Google Scholar
11. Partatt, L. G., “Electronic Band Structure of Solids by X-Ray Spectroscopy,” Rev. Mod, Phys. 31: 616, 1959.Google Scholar
12. Holliday, J. E., “Soft X-Ray Emission Spectroscopy in the 13- to 44-A Region,” J. Appl. Phys. 33: 3259, 1962.Google Scholar
13. Holliday, J. E., “Soft X-Ray Emission Spectroscopy in the 10 to 150 A Region,” Handbook of X-Rays, McGraw-Hill Book Company, New York, 1965, Chapter 38.Google Scholar
14. Baun, W. L. and Fischer, D. W., “The Effect of Chemical Combination on Some Soft X-Ray K and L Emission Spectra,” Advances in X-Ray Analysis, this volume, p. 329.Google Scholar
15. Fischer, D. W. and Baun, W. L., “The Effect of Chemical Combination on Long Wavelength K. and L X-Ray Spectra,” Anal. Chem. 37: 902, 1965.Google Scholar