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The Application of Linear Polarized X-rays After Bragg Reflection for X-ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

Peter Wobrauschek  and
Hannes Aiginger
Peter Wobrauschek
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstrasse 115, A-1020 Wien, Austria
Hannes Aiginger
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstrasse 115, A-1020 Wien, Austria
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Abstract

Polarized x-rays are used to excite samples of any kind and shape to emit characteristic radiation. In the appropriate geometry, where source-sample-ED detector are in any orthogonal position to each other, the exciting poLarized x-rays will be practically not scattered from sample and substrate into the detector. This reduces the background considerably and hence improves the lower limits of detection. The production of intensive polarized x-rays is done by using a single crystal-where Bragg reflection occurs at an angle 2 θ = 90° instead of amorphous low Z scatterers. The result is a linear polarized and monochromatic beam. The use of curved crystals instead of plane single crystals further increases the intensity of the exciting radiation. The lower limits of detection attainable with the recently constructed compact polarizer device are in the sub ppm range or in absolute amounts around 150 pg for medium Z elements.

Type
III. New Techniques and Instrumentation in XRF
Information
Advances in X-Ray Analysis , Volume 28: Thirty-Third Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1984 , 1984 , pp. 69 - 74
Copyright
Copyright © International Centre for Diffraction Data 1984

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References

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