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The Application of High-Resolution Solid State Detectors to X-Ray Spectrometry - A Review

Published online by Cambridge University Press:  06 March 2019

R. L. Heath*
Affiliation:
Aerojet Nuclear Company, National Reactor Testing Station Idaho Falls, Idaho
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Abstract

Developments during the past few years in solid-state radiation detectors and low-noise electronics employing field-effect transistors operated at cryogenic temperatures have resulted in the availability of high-resolution energy-dispersive spectrometers for a variety of applications in x-ray spectrometry. Using pulseamplitude analysis techniques, these spectrometers make it possible to obtain multi-elemental analyses on a routine laboratory basis employing x-ray fluorescence techniques. The combination of these spectrometers with small, inexpensive on-line computer data systems makes It possible to obtain rapid on-line qualitative and quantitative analysis of samples in the laboratory and in special field applications. A general review of the present state of development in detectors, electronics and on-line data systems will be presented together with descriptions of applications of such equipment in the laboratory.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1971

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References

1. Pell, E. M., J. Appl. Physics 31, 291 (1960).Google Scholar
2. Goulding, F. S. et al., X-Ray Analysis, Vol. 15, 20th Annual Denver X-Ray Conference, Denver, Colorado, August 11-13, 1971.Google Scholar
3. Smith, K. F. and Cline, J. E., IEEE Trans, on Nucl. Science, Vol. NS-23, No. 3, 468 (June 1966).Google Scholar
4. Goulding, F. S., Walton, J. and Malone, D., Nucl. Instr. and Methods 71, 273 (1969).Google Scholar
5. Kandiah, A., “Semiconductor Nuclear Particle Detectors and Circuits”, National Academy of Science Publication 15943, 495 (1969).Google Scholar
6. Knowlin, C. A. and Blankenship, J. L., Rev. Sci. Instr. 36, 1830 (1965).Google Scholar
7. Black, W. W., Nucl. Instr. and Methods 53, No. 2, 249 (1967).Google Scholar
8. Heath, R. L., in Modern Trends in Activation Analysis, National Bureau of Standards Special Publication 312, Vol. II (1969).Google Scholar
9. Heath, R. L., Nucl. Instr. and Methods 43, 209 (1966).Google Scholar
10. Helmer, R. G., Heath, R. L., Putnam, M. and Gipson, D. H., Nucl. Instr. and Methods 57, 46 (1969).Google Scholar
11. Gunnink, R. and Niday, J. B., in Modern Trends in Activation Analysis (Proc. Int. Conf. Gaithersburg, Maryland, 1968: Devoe, J. R., Editor) 2, NBS, Washington, D.C., 1244 (1969).Google Scholar
12. Yule, H. P., Nucl, Instr. and Methods 54, 61 (1967).Google Scholar
13. Connelly, A. L. and Black, W. W., Nucl. Instr. and Methods 82, 141 (1970).Google Scholar
14. Lubecki, A., J. Radioanal. Chem. 2, 3 (1969).Google Scholar
15. Campbell, W. J., Anal. Chem. 42, 248B (1970).Google Scholar
16. Walter, F. J., IEEE Trans, on Nucl. Science, NS-17, No. 3, 196 (June 1970).Google Scholar