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The Application of a Position-Sensitive X-Ray Detector to the Measurement of Residual Stresses

Published online by Cambridge University Press:  06 March 2019

M. R. James  and
J. B. Cohen
M. R. James
Affiliation:
The Technological Institute, Northwestern University Evanston, Illinois 60201
J. B. Cohen
Affiliation:
The Technological Institute, Northwestern University Evanston, Illinois 60201
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Abstract

In recent years considerable success has been achieved in the development of detectors for the localization of ionizing radiation. One dimensional position sensitive detectors have a number of uses in nuclear physics and in biological studies utilizing small-angle scattering. Detectors are now capable of providing position information of high resolution with a high count rats capability and a simple readout system. We report here on the feasibility of employing a position sensitive proportional counter (PSPC) for the measurement of residual stresses with X-rays.

Comparisons of the accuracy and time of data accumulation between a scintillation detector and a PSPC have been performed on stress relieved, shot peened steel specimens, and specimens deformed in tension.

The ability of obtaining the entire profile at once is somewhat offset by the lower efficiency of the PSPC when compared to a scintillation detector, but this is counteracted by the fact that motion of the detector is eliminated with the PSPC, It will be shown that a PSPC system provides a speed of data accumulation currently not available in any other way, while still remaining a versatile and accurate method.

Type
X-Ray Diffraction Applications
Information
Advances in X-Ray Analysis , Volume 19: Twenty-Fourth Annual Conference on Applications of X-ray Analysis, August 6-8, 1975 , 1975 , pp. 695 - 708
Copyright
Copyright © International Centre for Diffraction Data 1975

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