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Analysis of Heterogeneous Materials with X-Ray Microfujorescence and Microdiffraction

Published online by Cambridge University Press:  06 March 2019

D. A. Carpenter
Affiliation:
Center for Manufacturing Analysis, Oak Ridge Y-12 Plant, Oak Ridge, TN, USA
A. Gorin
Affiliation:
Development Division, Oak Ridge Y-12 Plant Oak Ridge, TN, USA
J. T. Shor
Affiliation:
Chemical Technology Division Oak Ridge National Laboratory, Oak Ridge, TN, USA
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Extract

The chemistry of heterogeneous materials can be understood only after determining the elements composing the material, the ways in which those elements combine, and the distribution of the resulting phases. The techniques of photon-induced x-ray microfluorescence (XRMF) and x-ray microdiffraction (XRMD) offer several advantages over conventional electron- beam methods for determinations of element and phase distributions. Those advantages include minimal specimen preparation, good element sensitivity, air operation, the capability of wide area coverage, and the availability of sophisticated search/match routines for phase identification.

Type
VII. Microbeam XRD and XRS Analysis
Copyright
Copyright © International Centre for Diffraction Data 1994

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References

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