Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-20T00:50:42.671Z Has data issue: false hasContentIssue false
  • English
  • Français

The Analysis of Carbon and Other Light Elements Using Layered Synthetic Microstructures

Published online by Cambridge University Press:  06 March 2019

John A. Anzelmo  and
Bradley W. Boyer
John A. Anzelmo
Affiliation:
Applied Research Laboratories, 15300 Rotunda Drive, Suite 301, Dearborn, Michigan 48120
Bradley W. Boyer
Affiliation:
Applied Research Laboratories, 15300 Rotunda Drive, Suite 301, Dearborn, Michigan 48120
Get access

Extract

Layered Synthetic Microstructures (LSM) for XRF instruments became commercially available in the early 1980's. It was quickly recognized that these devices improved the efficiency of diffraction for the elements boron through magnesium considerably over the LOD soap multilayers and single crystals available at that time. LSM devices of 40, 50, 80, and 120 ang-strom (2D) spacing were offered at first. Gradually, many different 2D spacings and compositions have become available, each with its own special area of application, usually limited to one or two elements.

Type
IV. Recent Developments in XRF Dispersion Devices
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 193 - 200
Copyright
Copyright © International Centre for Diffraction Data 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Price, B.J., Prissette, J.P., Juchli, K., A Review of Long and Ultra-long Wavelength XRF. Analysis, Internat. Labmate, (1985).Google Scholar
2. Gurvich, Y.M., An Advanced End-window XRF. Spectrometer for the Analysis of Light Elements, Am. Lab., Nov. (1984).Google Scholar
3. Gurvich, Y.M., Comparison of Yarious X-xay Tube Types for XRF. Analysis, “Adv. X-ray Anal.”, Vol. 28, (1985).Google Scholar
4. Bertin, E.P., “Principles and Practices of X-ray Spectro- metric Analysis”, Plenum, New York, (1975).Google Scholar
5. Cullity, B.D., “Elements of X-Ray Diffraction”, Addison- Wesley, Menlo Park, CA. (1978).Google Scholar
6. Spiller, E., Evaporated Multilayer Dispersion Elements for Soft X-rays, Proc. of A. I. P., Monterey, CA. pp. 124-130, (1981).Google Scholar
7. Barbee, T.W. Jr., Sputtered Layered Synthetic Microstructures (LSM) Dispersion Elements, Proc. of A. I. P., Monterey- CA. pp. 131-145, (1981).Google Scholar
8. Kikkert, J.N., X-ray Fluorescence Sees Light Elements, R&D. February, pp. 82-86, (1986).Google Scholar