Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-23T15:57:12.768Z Has data issue: false hasContentIssue false
  • English
  • Français

An X-Ray Small-Angle Scattering Instrument

Published online by Cambridge University Press:  06 March 2019

Donald M. Koffman
Donald M. Koffman*
Affiliation:
Advanced Metals Research Corporation Burlington, Massachusetts
Get access

Abstract

An X-ray small-angle scattering instrument is described which is used for recording X-ray diffraction patterns or small-angle X-ray scattering curves in an angular region very close to the direct beam. The measurement of X-ray intensity is accomplished with standard geiger or scintillation counter techniques. The instrument is designed for use with a spot-focus or vertical-line X-ray source, In essence, it is a multiple-reflection double-crystal diffractometer, based on a concept developed by Bonse and Hart, employing two grooved perfect germanium crystals arranged in the parallel position. Multiple diffraction from these crystals produces a monochromated X-ray beam which can be several millimeters wide while still exhibiting extremely high angular resolution. As a result, effective sample volumes can be employed with maximum volume-to-thickness ratios. The principal features of the instrument are discussed with emphasis on the advantages of this device over those employing complex slit systems and film-re cording techniques, Data are presented to illustrate the operation, intensity, and resolution of the unit.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 11: Sixteenth Annual Conference on Applications of X-ray Analysis, August 9-11, 1967 , 1967 , pp. 332 - 338
Copyright
Copyright © International Centre for Diffraction Data 1967

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Guinier, A. and Foumet, G., Small Angle Scattering of X-Rays, John Wiley & Sons, Inc., New York, 1955, p. 83.Google Scholar
2. Beeman, W. W., Kaesberg, P., Anderegg, J. W., and Webb, M. B., “Size of Particles and Lattice Defects,” Handbuch der Physik 22: 321, 1957.Google Scholar
3. Kaesberg, P., Beeman, W. W., and Ritland, H. N., “Double Crystal and Slit Methods in Small- Angle X-Ray Scattering,” Phys, Rev. 78: 336, 1950.Google Scholar
4. Slack, C. M., “The Refraction of X-Rays in Prisms of Various Materials,” Phys. Rev. 27: 691, 1926.Google Scholar
5. DuMond, J. W. M., “Method of Correcting Low Angle X-Ray Diffraction Curves for the Study of Small Particle Sizes,” Phys. Rev. 72: 83, 1947.Google Scholar
6. Bonse, U. and Hart, M., “Tailless X-Ray Single-Crystal Reflection Curves Obtained by Multiple Reflection,” Appl. Phys. Letters 7: 238, 1965.Google Scholar
7. Bonse, U. and Hart, M., “Small Angle X-Ray Scattering by Spherical Particles of Polyvinyltoluene,” Z. Physik 189: 151, 1966.Google Scholar
8. Rcnninger, M., “Messungen zur Rontgenstrahl-Optik des Ideal Kristalls, I. Bestatigung der Darwin-Ewald-Prins-Kohler Kurve,” Acta Cryst. 8: 597, 1955.Google Scholar
9. Kohra, K., “An Application for Obtaining X-Ray Beams of Extremely Narrow Angular Spread,” J. Phys. Soc. Japan 17: 589, 1962.Google Scholar
10. Baiterman, B. W., “Effect of Dynamical Diffraction in X-Ray Fluorescence Scattering,” Phys. Rev. 133: A759, 1964.Google Scholar
11. Rayleigh, Lord, “The Incidence of Light Upon a Transparent Sphere of Dimensions Comparable with the Wavelength,” Proc Roy. Sue. (London) A84: 25, 1911.Google Scholar
12. Gans, R., “Sttahlungsdiagramme Ultramikroskopischer Teilchen,” Ann Physik 76: 29, 1925.Google Scholar