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An Introduction to Total Reflection X-Ray Microscopy*

Published online by Cambridge University Press:  06 March 2019

James F. McGee
James F. McGee*
Affiliation:
Saint Louis University, Saint Louis, Missouri
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Abstract

The reflection X-ray microscope is a microscope in the conventional sense. X-rays are actually focused in the formation of magnified images of minute objects. Its principal component is a pair of concave glass mirrors whichhave been polished and figured with great care. In common with other optical devices, the reflection X-ray microscope suffers from various aberrations which limit its resolution. Until recently its narrow field and lack of contrast have made it impractical for the examination of histological or metallurgical specimens.

The X-ray microscope has the theoretical advantage of resolution when compared with the optical microscope. While it cannot compete with the ultimate resolution of the electron microscope, it has the advantage of being able to reveal the internal details of objects which are opaque to the electron microscope- Although there is no doubt that the X-ray microscope can contribute to our knowledge of structural details, perhaps its greatest potential lies in its analytical-chemistry aspects. Already a technique exists at unit magnification (contact microradiography) for weighing histological specimens whose cellular structures range from 10−12 to 10−14 g. The enlarged image provided by X-ray microscopy should greatly aid in a more extensive application of the technique.

The above advantages and possible areas of application are a source of continuous stimulation in the development of a reflection X-ray microscope which will operate close to its theoretical limit of resolution.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 3: Eighth Annual Conference on Applications of X-ray Analysis, August 12-14, 1959 , 1959 , pp. 213 - 233
Copyright
Copyright © International Centre for Diffraction Data 1959

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Footnotes

*

Work supported in part by the Research Corporation and the National Science Foundation.

References

1 Jentzsch, F., Physik Z., Vol. 30, 1929, p. 268.Google Scholar
2 Kirkpatrick, P. and Baez, A. V., J. Opt. Soc. Am., Vol. 38, 1948, p. 766.Google Scholar
3 Ehrenberg, W., Nature, Vol. 160, 1947, p. 330;J.Opt. Soc. Am., Vol. 39, 1949, p. 741; J. Opt. Soc. Am., Vol. 39, 1949, p. 746.Google Scholar
4 Reiser, L. M., Jr., J. Opt. Soc. Am., Vol. 47, 1957, p. 987.Google Scholar
5 Montel, M., Rev. Optique, Vol. 32, 1953, p. 585; Optic a Acta, Vol. 1, 1954, p. 117; C, R. Acad. Sci. Paris, Vol. 239, 1954, p. 39.Google Scholar
6 McGee, J. F., “A Long-Wavelength X-ray Reflection Microscope,” X-Ray Microscopy and Microradiography, edited by Cosslett et al., Academic Press, 1957.Google Scholar
7 Dyson, , J. Proc. Phys. Soc. (London) B Vol. 65, 1952, p. 580.Google Scholar
3 McGee, J. F. and Milton, J. W., Proceedings of the Second International Symposium on X-Ray Microscopy and X-Ray Microanalysis, Stockholm, 1959 (in press).Google Scholar
9 Crout, P. D., Trans. Am. Inst. Elec. Engrs., 1941, 60:1235–1240.Google Scholar
10 Prince, E., J. Appl. Phys., Vol. 21, 1950, p. 698.Google Scholar
11 Henke, B. L., B. Lundberg, and Engstrom, , X-Ray Microscopy and Microradiography, edited by Cosslett et al., Academic Press, 1957.Google Scholar
12 Koehler, W. F., J. Opt. Soc. Am., Vol. 43, 1953, p. 743; W.F. Koehler and W.C. White, J. Opt. Soc. Am., Vol. 45, 1955, p. 1011,Google Scholar
13 Ehrenberg, W., J. Opt. Soc. Am., Vol. 39, 1949, p. 746.Google Scholar