Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-17T21:25:26.398Z Has data issue: false hasContentIssue false
  • English
  • Français

An Empirical Background Calculation Method for Multi-Channel X-Ray Spectrometers

Published online by Cambridge University Press:  06 March 2019

R. B. Kellogg
R. B. Kellogg*
Affiliation:
Environmental Chemistry and Emissions Research, Northrop Services, Inc. - Environmental Sciences, Research Triangle Park, NC 27709
Get access

Extract

Several literature references address the relationship between the reciprocal of the absorption coefficient and the Compton scatter peak, intensity. Most workers use a Compton scattered tube line in the calculation of background; however, use of Bremsstrahlung scatter in the present work is also valid for this calculation. Background calculation for a fixed-angle monochromator is desirable since the background cannot be measured off peak. A method for calculating background for fixed-channel instruments by summing the calculated Rayleigh and Compton scatter intensities is presented in this paper.

Type
VII. Mathematical Models and Computer Applications in XRF
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 441 - 448
Copyright
Copyright © International Centre for Diffraction Data 1983

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Reynolds, R. C., Matrix corrections in trace element analysis by X-ray fluorescence:Estimation coefficient by Compton scattering, Am. Mineral. 48:1133 (1963).Google Scholar
2. Feather, C. E. and Willis, J. P., A simple method for background and matrix correction of spectra peaks in trace element determination by X-ray fluorescence spectrometry, X-ray Spectrom. 5:41 (1976).Google Scholar
3. Meier, H. and Unger, E., On the application of radioisotope X-ray fluorescence analysis for the solution of environnental and industrial problems, J. Radioanal. Chem. 32:413 (1976).Google Scholar
4. Markowitz, A., A Method of correction for absorption matrix effects in sampled of ‘intermediate’ thickness in EDXRF analysis, X-Ray Spectrom. 8:14 (1979).Google Scholar
5. Wagman, J., Bennett, R. L., and Knapp, K. T., “X-Ray Fluorescence Multi-Spectrometer for Rapid Elemental Analysis of Particulate Pollutants,” Report No. 600/2-76-003, U.S. Environmental Protection Agency, Washington, D.C. (1976).Google Scholar