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An Automated System for Extended X-Ray Absorption Measurements

Published online by Cambridge University Press:  06 March 2019

G. D. Christofferson ,
T. R. Hughes  and
R. F. Klaver
G. D. Christofferson
Affiliation:
California Research Corporation Richmond, California
T. R. Hughes
Affiliation:
California Research Corporation Richmond, California
R. F. Klaver
Affiliation:
California Research Corporation Richmond, California
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Abstract

In the study of X-ray absorption fine structure, one is faced with the task of measuring sample absorbance over an extended wavelength region. For the sake of accuracy, these measurements are often carried out on a fixed-count basis. Manual collection of the data at a hundred or more spectrometer settings is a tedious and time-consuming chore. This paper describes an automated system for accumulating absorption data.

The equipment is used in conjunction with a Philips wide-range goniometer employed as a single-crystal spectrometer. It consists of: (1) a four-position sample changer, (2) a fixed-count selector for each sample position, (3) a five-digit counter and paper tape printer which register and record sample identification and counting times based on a 60-cps clock frequency, and (4) a programmer. The spectrometer advance is accomplished using the Philips step-scan arrangement. An IBM 7094 FORTRAN program for data reduction and computation will be described. The possibility of using X-ray absorption fine-structure measurements as a quantitative method for determining the various absorbing species will be discussed.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 8: Thirteenth Annual Conference on Applications of X-ray Analysis, August 12-14, 1964 , 1964 , pp. 180 - 188
Copyright
Copyright © International Centre for Diffraction Data 1964

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