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An Approach to the Automation of a Multifunction X-Ray Diffraction Laboratory

Published online by Cambridge University Press:  06 March 2019

T. L. Nunes
T. L. Nunes*
Affiliation:
IBM Corporation, Hopwell Junction, New York
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Extract

A variety of x-ray diffractometers supporting stress measurements, routine phase identification, precision lattice parameter determinations, crystallite size estimates, and high temperature studies have been interfaced to a central minicomputer. The unique attributes of each instrument have been retained while the central minicomputer provides a common control format, data storage area, and analysis program library. Two movable desk top computers provide limited backup for the minicomputer, and serve as test beds for technique development.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 24: Twenty-Ninth Annual Conference on Applications of X-ray Analysis, August 4-8, 1980 , 1980 , pp. 121 - 122
Copyright
Copyright © International Centre for Diffraction Data 1980

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References

1. Nunes, T. L., Mini and Micro Computer, Vol. 5, 1980.Google Scholar
2. Walker, G. A. and Goldsmith, C. C., Proceedings of the 1978 Reliability Physics Symposium, San Diego, California, April 18-20, 1978, pp. 56-58.Google Scholar
3. Rigaku, U.S.A., Inc., Danvers, Massachusetts,Google Scholar