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Advances in Fundamental-Parameter Methods for Quantitative XRFA

Published online by Cambridge University Press:  06 March 2019

Michael Mantler
Michael Mantler*
Affiliation:
Technical University Vienna A -1040 Vienna, Austria
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Extract

The fundamental-parameter technique is an important tool for quantitative x-ray chemical analysis and is routinely applied for the quantification of bulk specimens and single layer films. A method extending it to multiple film layers has recently been introduced by Mantler and results from such applications have been reported by Huang and Parrish. In addition, fundamental-parameter methods can be employed to predict intensity ratios of fluorescent lines as well as the spectral distribution of radiation scattered by the specimen (shape of the background in the vicinity of emission, lines). This is useful for accurate quantitative analysis in the case of a poor peak-to-background ratio, where the precise determination of net intensities is difficult.

Type
III. XRF Fundamental Parameters and Data Analysis
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 97 - 104
Copyright
Copyright © International Centre for Diffraction Data 1986

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References

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