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Accuracy in Angle and Intensity Measurements in X-Ray Powder Diffraction

Published online by Cambridge University Press:  06 March 2019

Robert L. Snyder
Robert L. Snyder*
Affiliation:
N.Y.S. College of Ceramics, Alfred University, Alfred, N.Y.
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Extract

The advent of computer automation and profile fitting techniques in powder diffraction., along with a general solution to the problem of preferred orientation, has opened a series of new horizons for this method. The new levels of accuracy attainable have brought us to the threshold of routine reliable qualitative phase identification, high precision quantitative analysis and the ability to perform crystal structure analysis on some of the most important technological materials. It has been primarily the question of accuracy which has held up these developments until now.

Type
I. Accuracy in X-Ray Powder Diffraction
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 1 - 10
Copyright
Copyright © International Centre for Diffraction Data 1982

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References

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