Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-23T12:56:55.275Z Has data issue: false hasContentIssue false
  • English
  • Français

100 Years of Progress in X-Ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

John V. Gilfrich
John V. Gilfrich*
Affiliation:
Naval Research Laboratory Washington, DC 20375-5345 and SFA, Inc. 1401 McCormick Drive Landover, MD 20785-5322
Get access

Abstract

In the 100 years since the landmark work of Wilhelm Conrad Röntgen, much progress has been made in X-ray science and applications. X-ray Fluorescence Analysis (XRF) essentially had its beginning not long after that development, when, in 1913, Moseley demonstrated the relationship between the atomic number of an element and the wavelength of its X-ray spectra. As early as the 1930's, workers were analyzing materials for trace elements. By the time of the 1940's, X-ray spectroscopic instruments were becoming commercially available, and analysts were beginning to appreciate the simplicity of the X-ray spectra, and thus the potential for a significant impact on elemental analysis.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 29 - 39
Copyright
Copyright © International Centre for Diffraction Data 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Moseley, H. G. J., Phil. Mag 26, 1024 (1913); 27, 703 (1914).Google Scholar
2. R, W. C.öntgen, Ann. Phys. Chem. 64, 1 (1898).Google Scholar
3. Barkla, C. G. and Sadler, C. A., Phil. Mag. 16550 (1908).Google Scholar
4. Beatty, R. T., Proc. Roy. Soc. 87A, 511 (1912).Google Scholar
5. Friedrich, W., Snipping, P. and Laue, M. V., Acad. Wissen Munich 42, 303 (1912).Google Scholar
6. Bragg, W. H. and Bragg, W. L., Proc. Roy. Soc. 88A, 428 (1913).Google Scholar
7. Coster, D. and von Hevesy, G., Nature, Land 111 79, 182 (1923).Google Scholar
8. de Broglie, M., Compt. Rend. 158, 1493 (1914).Google Scholar
9. Jönsson, A., Z. Physik 36, 426 (1926).Google Scholar
10. Friedman, H. and Birks, L. S., Rev. Sci. Instr. 19, 323 (1948).Google Scholar
11. Hillier, J., U. S. Patent 2, 418 029 (1947).Google Scholar
12. Birks, L. S. and Siomkajlo, J. M., Spectrochim. Acta 18, 363 (1962).Google Scholar
13. de, J. L. Vries, “Early Development in X-ray Instrumentation, 1950-1970”, Plenary Lecture at the 44th Annual Denver X-ray Conference, Colorado Springs, Colorado, August 2, 1995.Google Scholar
14. Goulding, F. S., Jaklevic, J. M., Jarrett, B. V. and Landis, D. A., Adv. in X-ray Anal. 25, 470 (1972).Google Scholar
15. Birks, L. S. and Batt, A. P., Anal. Chem. 35, 778 (1963).Google Scholar
16. Beaty, H. J. and Brissey, R. M., Anal. Chem. 26, 980 (1954).Google Scholar
17. Rasberry, S. D. and Heinrich, K. F. J., Anal. Chem. 46, 81 (1974).Google Scholar
18. Sherman, J., Spectrochim. Acta 7, 283 (1955).Google Scholar
19. Shiraiwa, T. and Fujino, N., Japan J. Appl. Phys. 5, 886 (1966).Google Scholar
20. Criss, J. W., Naval, U. S. Research Laboratory, private communication, 1966.Google Scholar
21. Criss, J. W., Birks, L. S. and Gilfrich, J. V. Anal. Chem. 50, 33 (1978).Google Scholar
22. Tao, G. Y., Pella, P. A. and Rousseau, R. M., Nat. Bur. Stand. Tech. Note No. 1213 (1985).Google Scholar
23. He, T., Gardner, R. P. and Verghese, K., Adv. in X-ray Anal. 35, 727 (1992).Google Scholar
24. Claisse, F. and Quintin, M., Can. Spectrosc. 12, 1929 (1967).Google Scholar
25. Criss, J. W., Anal. Chem. 48, 179 (1976).Google Scholar
26. Birks, L. S., Gilfrich, J. V. and Burkhalter, P. G., “Development of X-ray Fluorescence Spectroscopy for Elemental Analysis of Particulate Matter in the Atmosphere and in Source Emissions”, EPA Report No. EPA-R2-73-182, April 1973.Google Scholar
27. Panayappan, R., Venezky, D. L., Gilfrich, J. V. and Birks, L. S., Anal. Chem. 50, 1125 (1978).Google Scholar
28. Raab, G. A., Kuharic, C. A., Cole, W. H. III, Enwall, R. E. and Duggan, J. S., Adv. in X-ray Anal. 33, 629 (1990).Google Scholar
29. Gamage, C. F. and Yopham, W. H., Adv. in X-ray Anal. 17, 542 (1974).Google Scholar
30. Birks, L. S., Seebold, R. E., Batt, A. P. and Grosso, J. S., J. Appl. Phys. 35, 2578 (1964).Google Scholar
31. Birks, L. S., Pure and Appl. Chem. 48, 45 (1976).Google Scholar