Published online by Cambridge University Press: 24 September 2021
Chapter 5 describes techniques to determine the localstructure of materials both on an atomic and microscopic scale that do not rely on X-ray crystal diffraction. These include small angle scattering (SAXS) and wide angle scattering (WAXS), near-edge and extended X-ray absorption fine structure spectroscopy (XAFS, NEXAFS, EXAFS) but also photoelectron diffraction and X-ray fluorescence holography.
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